Proton radiation damage experiment for X-ray SOI pixel detectors von Yarita, Keigo, Kohmura, Takayoshi, Hagino, Kouichi, Kogiso, Taku, Oono, Kenji, Negishi, Kousuke, Tamasawa, Koki, Sasaki, Akinori, Yoshiki, Satoshi, Tsuru, Takeshi Go, Tanaka, Takaaki, Matsumura, Hideaki, Tachibana, Katsuhiro, Hayashi, Hideki, Harada, Sodai, Takeda, Ayaki, Mori, Koji, Nishioka, Yusuke, Takebayashi, Nobuaki, Yokoyama, Shoma, Fukuda, Kohei, Arai, Yasuo, Miyoshi, Toshinobu, Kurachi, Ikuo, Hamano, Tsuyoshi

Volltext

X-ray response evaluation in subpixel level for X-ray SOI pixel detectors von Negishi, Kousuke, Kohmura, Takayoshi, Hagino, Kouichi, Kogiso, Taku, Oono, Kenji, Yarita, Keigo, Sasaki, Akinori, Tamasawa, Koki, Go Tsuru, Takeshi, Tanaka, Takaaki, Matsumura, Hideaki, Tachibana, Katsuhiro, Hayashi, Hideki, Harada, Sodai, Mori, Koji, Takeda, Ayaki, Nishioka, Yusuke, Takebayashi, Nobuaki, Yokoyama, Shoma, Fukuda, Kohei, Arai, Yasuo, Miyoshi, Toshinobu, Kishimoto, Shunji, Kurachi, Ikuo

Volltext

Proton Damage Experiment and Investigation of Degradation Mechanism of XRPIX von Yarita, Keigo, Kohmura, Takayoshi, Hagino, Kouichi, Kogiso, Taku, Oono, Kenji, Negishi, Kousuke, Sasaki, Akinori, Suzuki, Yuta, Hagiya, Kohei, Yoshiki, Satoshi, Tamasawa, Koki, Tsuru, Takeshi, Tanaka, Takaaki, Matsumura, Hideaki, Tachibana, Katsuhiro, Hayashi, Hideki, Harada, Sodai, Takeda, Ayaki, Mori, Koji, Nishioka, Yusuke, Takebayashi, Nobuaki, Yokoyama, Shoma, Fukuda, Kohei, Arai, Yasuo, Miyoshi, Toshinobu, Kishimoto, Shunji, Kurachi, Ikuo, Hamano, Tsuyoshi, group, the SOIPIX

Volltext

Evaluation of soft X-ray detection efficiency in subpixel scale of SOI pixel sensors von Negishi, Kousuke, Kohmura, Takayoshi, Hagino, Koichi, Kogiso, Taku, Oono, Kenji, Yarita, Keigo, Tsuru, Takeshi, Tanaka, Takaaki, Matsumura, Hideaki, Tachibana, Katsuhiro, Hayashi, Hideki, Mori, Koji, Nishioka, Yusuke, Takeda, Ayaki, Takebayashi, Nobuaki, Yokoyama, Shoma, Fukuda, Kohei, Arai, Yasuo, Miyoshi, Toshiki, Kishimoto, Syunji, group, Other SOIPIX

Volltext

次世代型X線撮像分光器XRPIXの陽子線損傷実験および回路損傷部分の究明 von 鑓田, 敬吾, 幸村, 孝由, 萩野, 浩一, 小木曽, 拓, 大野, 顕司, 根岸, 康介, 笹木, 彬礼, 鈴木, 雄太, 萩谷, 幸平, 吉木, 知, 玉澤, 晃希, 鶴, 剛, 田中, 孝明, 内田, 裕之, 松村, 英晃, 立花, 克裕, 林, 秀輝, 原田, 颯大, 武田, 彩希, 森, 浩二, 西岡, 祐介, 武林, 伸明, 横山, 聖真, 福田, 昂平, 新井, 康夫, 三好, 敏喜, 岸本, 俊二, 倉知, 郁生, 濱野, 毅, 他SOIPIXグループ

Volltext

軟X線に対するX線用SOIPIX検出器のサブピクセルレベルの検出効率の評価 von 根岸, 康介, 幸村, 孝由, 萩野, 浩一, 小木曽, 拓, 大野, 顕司, 鑓田, 敬吾, 鶴, 剛, 田中, 孝明, 松村, 英晃, 立花, 克裕, 林, 秀輝, 森, 浩二, 西岡, 祐介, 武田, 彩希, 武林, 伸明, 横山, 聖真, 福田, 昂平, 新井, 康夫, 三好, 敏喜, 岸本, 俊二, 他SOIPIXグループ

Volltext

X-ray response evaluation in subpixel level for X-ray SOI pixel detectors von Negishi, Kousuke, Kohmura, Takayoshi, Hagino, Kouichi, Kogiso, Taku, Oono, Kenji, Yarita, Keigo, Sasaki, Akinori, Tamasawa, Koki, Tsuru, Takeshi G, Tanaka, Takaaki, Matsumura, Hideaki, Tachibana, Katsuhiro, Hayashi, Hideki, Harada, Sodai, Mori, Koji, Takeda, Ayaki, Nishioka, Yusuke, Takebayashi, Nobuaki, Yokoyama, Shoma, Fukuda, Kohei, Arai, Yasuo, Miyoshi, Toshinobu, Kishimoto, Shunji, Kurachi, Ikuo

Volltext

Proton Radiation Damage Experiment for X-Ray SOI Pixel Detectors von Yarita, Keigo, Kohmura, Takayoshi, Hagino, Kouichi, Kogiso, Taku, Oono, Kenji, Negishi, Kousuke, Tamasawa, Koki, Sasaki, Akinori, Yoshiki, Satoshi, Takeshi Go Tsuru, Tanaka, Takaaki, Matsumura, Hideaki, Tachibana, Katsuhiro, Hayashi, Hideki, Harada, Sodai, Takeda, Ayaki, Mori, Koji, Nishioka, Yusuke, Takebayashi, Nobuaki, Yokoyama, Shoma, Fukuda, Kohei, Arai, Yasuo, Miyoshi, Toshinobu, Kurachi, Ikuo, Hamano, Tsuyoshi, the SOIPIX group

Volltext

A consideration on robust design optimization problem through formulation of multiobjective optimization von ITO, Makoto, KOGISO, Nozomu, HASEGAWA, Taku

Volltext