Tungsten Silicide Gate Etching with Very High WSix to Poly-Si Selectivity and Low WSix Etch Rate Micro-Loading in the High Density Plasma von Ko, Yong Deuk, Chun, Hui-Gon, Choi, Jinhan

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EPD time delay as WSix stack down gate etching in DPS+ chamber von Yong Deuk Ko, Hui-Gon Chun, Jing-Hyuk Lee, Jae-Ho Byun, Jae-Pil Jeon, Yong-Hwa Song, Tong-Yul Cho

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Method of reducing particulates in a plasma etch chamber during a metal etch process von Ko, Yong Deuk, Oh, Se Jin, Jung, Chan Ouk, Hwang, Jeng H

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Method of reducing particulates in a plasma etch chamber during a metal etch process von Ko, Yong Deuk, Oh, Se Jin, Jung, Chan Ouk, Hwang, Jeng

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METHOD AND APPARATUS FOR SEARCHING INDEX IN A VCR von KO, YONG-DEUK

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Method of reducing particulates in a plasma etch chamber during a metal etch process von JUNG CHAN OUK, OH SE JIN, KO YONG DEUK, HWANG JENG H

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Method of reducing particulates in a plasma etch chamber during a metal etch process von JUNG CHAN OUK, OH SE JIN, KO YONG DEUK, YING CHENTSAU, HWANG JENG H

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Method of reducing particulates in a plasma etch chamber during a metal etch process von JUNG CHAN OUK, OH SE JIN, KO YONG DEUK, HWANG JENG H

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THE POSITION CONTROLLER OF THE ROBOT von KO DEUK-YONG

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METHOD OF REDUCING PARTICULATES IN A PLASMA ETCH CHAMBER DURING A METAL ETCHING PROCESS von JUNG, CHAN OUK, OH, SE JIN, KO, YONG DEUK, HWANG JENG H

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Design and Performance Test of 2 kW Class Reverse Brayton Cryogenic System von Lee, Keuntae, Koh, Deuk-Yong, Ko, Junseok, Yeom, Hankil, Son, Chang-Hyo, Yoon, Jung-In

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Revision of WDM7 Microphysics Scheme and Evaluation for Precipitating Convection over the Korean Peninsula von Jang, Sungbin, Lim, Kyo-Sun Sunny, Ko, Jeongsu, Kim, Kwonil, Lee, GyuWon, Cho, Su-Jeong, Ahn, Kwang-Deuk, Lee, Yong-Hee

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Experimental Study on Vaporization of Subcooled Liquid Nitrogen by Instantaneous Heat Generation in LN2 Chamber for HTS-FCL von In, Sehwan, Yeom, Hankil, Ko, Junseok, Hong, Yong-Ju, Kim, Hyobong, Park, Seong-Je, Koh, Deuk-Yong, Kim, Hye-Rim

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Study on Thermal Response to Instantaneous Heat Generation in LN2 Chamber for HTS-FCL von Ko, Junseok, Yeom, Hankil, Hong, Yong-Ju, Kim, Hyobong, Park, Seong-Je, Koh, Deuk-Yong, Kim, Hye-Rim

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Dependence of Hot Carrier Reliability and Low Frequency Noise on Channel Stress in Nanoscale n-Channel Metal--Oxide--Semiconductor Field-Effect Transistors von Kwon, Hyuk-Min, Bok, Jung-Deuk, Han, In-Shik, Park, Sang-Uk, Jung, Yi-Jung, Jang, Jae-Hyung, Ko, Sung-Yong, Lee, Won-Mook, Lee, Ga-Won, Lee, Hi-Deok

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Analysis of electric circuit using capacitor for driving linear compressor von Ko, Jun-Seok, Kim, Hyo-Bong, Park, Seong-Je, Hong, Yong-Ju, Yeom, Han-Kil, Koh, Deuk-Yong

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Suppression of performance degradation due to cold-head orientation in GM-type pulse tube refrigerator von Ko, Junseok, Kim, Hyobong, Park, Seong-Je, Hong, Yong-Ju, Koh, Deuk-Yong, Yeom, Hankil

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Dependence of Hot Carrier Reliability and Low Frequency Noise on Channel Stress in Nanoscale n-Channel Metal–Oxide–Semiconductor Field-Effect Transistors von Kwon, Hyuk-Min, Bok, Jung-Deuk, Han, In-Shik, Park, Sang-Uk, Jung, Yi-Jung, Jang, Jae-Hyung, Ko, Sung-Yong, Lee, Won-Mook, Lee, Ga-Won, Lee, Hi-Deok

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Orientation dependence of GM-type pulse tube refrigerator von Ko, Jun-Seok, Kim, Hyo-Bong, Park, Seong-Je, Hong, Yong-Ju, Yeom, Han-Kil, Lee, Chung-Soo, Kang, In-Su, Koh, Deuk-Yong

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Experimental research on 2 stage GM-type pulse tube refrigerator for cryopump von 박성제, 고준석, 홍용주, 김효봉, 염한길, 고득용

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