A 0.127 μm2 High Performance 65nm SOI Based embedded DRAM for on-Processor Applications von Wang, G., Cheng, K., Ho, H., Faltermeier, J., Kong, W., Kim, H., Cai, J., Tanner, C., McStay, K., Balasubramanyam, K., Pei, C., Ninomiya, L., Li, X., Winstel, K., Dobuzinsky, D., Naeem, M., Zhang, R., Deschner, R., Brodsky, M.J., Allen, S., Yates, J., Feng, Y., Marchetti, P., Norris, C., Casarotto, D., Benedict, J., Kniffm, A., Parise, D., Khan, B., Barth, J., Parries, P., Kirihata, T., Norum, J., Iyer, S.S.

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The evolutionary psychology of facial beauty von RHODES, Gillian

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Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs von Kim, Dae-Hyun, Cha, Soonyoung, Milor, Linda S.

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Inherited thrombophilic risk factors and venous thromboembolism : Distinct role in peripheral deep venous thrombosis and pulmonary embolism von MARGAGLIONE, Maurizio, BRANCACCIO, Vincenzo, DE LUCIA, Domenico, MARTINELLI, Ida, CIAMPA, Antonio, GRANDONE, Elvira, DI MINNO, Giovanni

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Refrigerator von Kim, Ill-Shin, Yu, Seon-Il, Seok, Kun-Jun, Kwon, Yong-Chol

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Empirical Evidence on Marketplace Alienation von Bearden, William O., Mason, J. Barry

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For War-Time Saving and ECONOMY

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