In-situ X-ray Diffraction study of Metal Induced Crystallization of amorphous silicon von Knaepen, W., Detavernier, C., Van Meirhaeghe, R.L., Jordan Sweet, J., Lavoie, C.

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High- k dielectrics for future generation memory devices (Invited Paper) von Kittl, J.A., Opsomer, K., Popovici, M., Menou, N., Kaczer, B., Wang, X.P., Adelmann, C., Pawlak, M.A., Tomida, K., Rothschild, A., Govoreanu, B., Degraeve, R., Schaekers, M., Zahid, M., Delabie, A., Meersschaut, J., Polspoel, W., Clima, S., Pourtois, G., Knaepen, W., Detavernier, C., Afanas’ev, V.V., Blomberg, T., Pierreux, D., Swerts, J., Fischer, P., Maes, J.W., Manger, D., Vandervorst, W., Conard, T., Franquet, A., Favia, P., Bender, H., Brijs, B., Van Elshocht, S., Jurczak, M., Van Houdt, J., Wouters, D.J.

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In situ x-ray diffraction study of metal induced crystallization of amorphous germanium von Knaepen, W., Gaudet, S., Detavernier, C., Van Meirhaeghe, R. L., Sweet, J. Jordan, Lavoie, C.

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Anisotropic thermal expansion of Ni, Pd and Pt germanides and silicides von Geenen, F A, Knaepen, W, Moens, F, Brondeel, L, Leenaers, A, Van den Berghe, S, Detavernier, C

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The influence of Pt redistribution on Ni1−xPtxSi growth properties von Demeulemeester, J., Smeets, D., Comrie, C. M., Van Bockstael, C., Knaepen, W., Detavernier, C., Temst, K., Vantomme, A.

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Determination of the dominant diffusing species during nickel and palladium germanide formation von Comrie, C.M., Smeets, D., Pondo, K.J., der Walt, C. van, Demeulemeester, J., Knaepen, W., Detavernier, C., Habanyama, A., Vantomme, A.

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On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films von Geenen, F.A., Knaepen, W., Demeulemeester, J., De Keyser, K., Jordan-Sweet, J.L., Lavoie, C., Vantomme, A., Detavernier, C.

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Formation and texture of palladium germanides studied by in situ X-ray diffraction and pole figure measurements von Geenen, F.A., Knaepen, W., De Keyser, K., Opsomer, K., Vanmeirhaeghe, R.L., Jordan-Sweet, J., Lavoie, C., Detavernier, C.

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In situ X-ray diffraction study of thin film Ir/Si solid state reactions von Knaepen, W., Demeulemeester, J., Deduytsche, D., Jordan-Sweet, J.L., Vantomme, A., Van Meirhaeghe, R.L., Detavernier, C., Lavoie, C.

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Merits of Batch ALD von Dingemans, Gijs, Jongbloed, Bert, Knaepen, Werner, Pierreux, Dieter, Jdira, Lucian, Terhorst, Herbert

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Comparative Study of Flat and Round Collectors Using a Validated 1D Fluid Probe Model von Peleman, P., Jachmich, S., Van Schoor, M., Van Oost, G., Knaepen, W., Boucher, C.

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On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films von Geenen, F.A, Knaepen, W, Demeulemeester, Jelle, De Keyser, K, Jordan-Sweet, J.L, Lavoie, C, Vantomme, André, Detavernier, C

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In situ study of the growth properties of Ni-rare earth silicides for interlayer and alloy systems on Si(100) von Demeulemeester, J., Knaepen, W., Smeets, D., Schrauwen, A., Comrie, C. M., Barradas, N. P., Vieira, A., Detavernier, C., Temst, K., Vantomme, A.

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The influence of Pt redistribution on Ni 1 − x Pt x Si growth properties von Demeulemeester, J., Smeets, D., Comrie, C. M., Van Bockstael, C., Knaepen, W., Detavernier, C., Temst, K., Vantomme, A.

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The influence of Pt redistribution on Ni{sub 1-x}Pt{sub x}Si growth properties von Demeulemeester, J., Smeets, D., Temst, K., Vantomme, A., Comrie, C. M., Van Bockstael, C., Knaepen, W., Detavernier, C.

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In situ X-ray Diffraction Study of Ni–Yb Interlayer and Alloy Systems on Si„100 von Knaepen, W., Demeulemeester, J, Jordan-Sweet, J, Vantomme, A, Detavernier, C, Van Meirhaeghe, R, Lavoie, C

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In situ x-ray diffraction study of Ni–Yb interlayer and alloy systems on Si(100) von Knaepen, W., Demeulemeester, J., Jordan-Sweet, J., Vantomme, A., Detavernier, C., Van Meirhaeghe, R. L., Lavoie, C.

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In situ x-ray diffraction study of Ni-Yb interlayer and alloy systemson Si(100) von Knaepen, W., Demeulemeester, J., Jordan-Sweet, J., Vantomme, A., Detavernier, C., Van Meirhaeghe, R. L., Lavoie, C.

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State-of-the-art of NORM nuclide determination in samples from oil and gas production: Validation of potential standardization methods through an interlaboratory test programme von Knaepen, W. A. I., Bergwerf, W., Lancée, P. J. F., Van Dijk, W., Jansen, J. F. W., Janssen, R. G. C., Kiezenberg, W. H. T., Van Sluijs, R., Tijsmans, M. H., Volkers, K. J., Voors, P. I.

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High-k Dielectrics and Metal Gates for Future Generation Memory Devices von Kittl, Jorge A., Opsomer, Karl, Popovici, M, Menou, N., Kaczer, Ben, Wang, X. P., Adelmann, C., Pawlak, M. A., Tomida, K., Rothschild, Aude, Govoreanu, Bogdan, Degraeve, R., Schaekers, M., Zahid, M, Delabie, A., Meersschaut, J., Polspoel, W., Clima, Sergiu, Pourtois, Geoffrey, Knaepen, W., Detavernier, Christophe, Afanas'ev, Valery, Blomberg, T., Pierreux, D., Swerts, J., Fischer, P., Maes, J. W., Manger, D., Vandervorst, Wilfried, Conrad, T., Franquet, A., Favia, P., Bender, Hugo, Brijs, B., Van Elshocht, S., Jurczak, Malgorzata, Van Houdt, J., Wouters, Dirk J.

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