X-ray induced damage in DNA monitored by X-ray photoelectron spectroscopy von Ptasińska, Sylwia, Stypczyńska, Agnieszka, Nixon, Tony, Mason, Nigel J, Klyachko, Dimitri V, Sanche, Léon

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Halogen Anion Formation in 5-Halouracil Films: X Rays Compared to Subionization Electrons von Klyachko, Dimitri V., Huels, Michael A., Sanche, Léon

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High-voltage energy dispersive x-ray spectrometry using a low-energy primary beam von Wu, Ying, Klyachko, Dimitri, Davilla, Scott, Spallas, James, Indermuehle, Scott, Muray, Lawrence P.

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X-ray induced damage in DNA monitored by X-ray photoelectronspectroscopy von Ptasińska, Sylwia, Stypczyńska, Agnieszka, Nixon, Tony, Mason, Nigel J., Klyachko, Dimitri V., Sanche, Léon

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OPTICAL SENSORS FOR MEASURING PROPERTIES OF CONSUMABLE PARTS IN A SEMICONDUCTOR PLASMA PROCESSING CHAMBER von MALEEV, Ivan, TIAN, Xinkang, KLYACHKO, Dimitri, MENG, Ching Ling, LU, Shin-Yee

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OPTICAL SENSORS FOR MEASURING PROPERTIES OF CONSUMABLE PARTS IN A SEMICONDUCTOR PLASMA PROCESSING CHAMBER von MALEEV, Ivan, TIAN, Xinkang, KLYACHKO, Dimitri, MENG, Ching Ling, LU, Shin-Yee

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OPTICAL SENSORS FOR MEASURING PROPERTIES OF CONSUMABLE PARTS IN A SEMICONDUCTOR PLASMA PROCESSING CHAMBER von MALEEV, Ivan, TIAN, Xinkang, KLYACHKO, Dimitri, MENG, Ching Ling, LU, Shin-Yee

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반도체 플라즈마 공정 챔버 내의 소모성 부품의 특성을 측정하기 위한 광센서 von LU SHIN YEE, MALEEV IVAN, KLYACHKO DIMITRI, TIAN XINKANG, MENG CHING LING

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Optical sensors for measuring properties of consumable parts in a semiconductor plasma processing chamber von LU, SHIN-YEE, MENG, CHING LING, TIAN, XINKANG, KLYACHKO, DIMITRI, MALEEV, IVAN

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High-voltage energy-dispersive spectroscopy using a low-voltage scanning electron microscope von SPALLAS JAMES P, MURAY LAWRENCE P, INDERMUEHLE SCOTT W, KLYACHKO DIMITRI, WU YING

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HIGH-VOLTAGE ENERGY-DISPERSIVE SPECTROSCOPY USING A LOW-VOLTAGE SCANNING ELECTRON MICROSCOPE von SPALLAS JAMES P, MURAY LAWRENCE P, INDERMUEHLE SCOTT W, KLYACHKO DIMITRI, WU YING

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Step function determination of Auger peak intensity von VASILYEV LEONID, BORODYANSKY SERGEY, KLYACHKO DIMITRI

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Step function determination of Auger peak intensity von Klyachko, Dimitri, Borodyansky, Sergey, Vasilyev, Leonid

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STEP FUNCTION DETERMINATION OF AUGER PEAK INTENSITY von VASILYEV, LEONID, BORODYANSKY, SERGEY, KLYACHKO, DIMITRI

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Step function determination of auger peak intensity von Klyachko, Dimitri, Borodyansky, Sergey, Vasilyev, Leonid

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Step function determination of auger peak intensity von VASILYEV LEONID, BORODYANSKY SERGEY, KLYACHKO DIMITRI

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Step function determination of auger peak intensity von DIMITRI KLYACHKO, SERGEY BORODYANSKY, LEONID VASILYEV

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STEP FUNCTION DETERMINATION OF AUGER PEAK INTENSITY von VASILYEV, LEONID, BORODYANSKY, SERGEY, KLYACHKO, DIMITRI

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