Reliability of Strained-Si Devices With Post-Oxide-Deposition Strain Introduction von Shickova, A., Verheyen, P., Eneman, G., Degraeve, R., Simoen, E., Favia, P., Klenov, D.O., San Andres, E., Kaczer, B., Jurczak, M., Absil, P., Maes, H.E., Groeseneken, G.

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Detection of individual atoms with energy dispersive x-ray spectroscopy in scanning transmission electron microscopy von Klenov, D.O.

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Solving structure of the interfaces using atomic level energy dispersive x-ray spectroscopy von Klenov, D.O., Carlsson, A.

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The Contribution of Thermally Scattered Electrons to Atomic Resolution Elemental Maps von Williams, R.E.A., Forbes, B.D., D'Alfonso, A.J., Srinivasan, R., Klenov, D.O., Freitag, B., Fraser, H.L., Allen, L.J., McComb, D.

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Vacancy ordering in the structure of γ-Al2O3 von Kryukova, G.N, Klenov, D.O, Ivanova, A.S, Tsybulya, S.V

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Vacancy ordering in the structure of γ-Al 2O 3 von Kryukova, G.N, Klenov, D.O, Ivanova, A.S, Tsybulya, S.V

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Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology von Schlossmacher, P., Klenov, D.O., Freitag, B., von Harrach, H.S.

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