Low-frequency noise in polysilicon emitter bipolar transistors von Markus, H.A.W., Kleinpenning, T.G.M.

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Low-frequency noise in modern bipolar transistors: impact of intrinsic transistor and parasitic series resistances von Kleinpenning, T.G.M.

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Location of low-frequency noise sources in submicrometer bipolar transistors von Kleinpenning, T.G.M.

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Relation between 1/ f noise and frequency-independent loss tangent von Kleinpenning, T G M

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Relation between variance and sample duration of 1/f noise signals von KLEINPENNING, T. G. M, DE KUIJPER, A. H

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Conduction mechanism and 1/ f noise in ZnO varistors von Kusy, A., Kleinpenning, T. G. M.

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On 1/f trapping noise in MOSTs von Kleinpenning, T.G.M.

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A new 1/f noise model for metal-oxide-semiconductor field-effect transistors in saturation and deep saturation von ZHU, Y, DEEN, M. J, KLEINPENNING, T. G. M

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Model for 1/ f noise in metal-oxide-semiconductor transistors von Kleinpenning, T. G. M., Vandamme, L. K. J.

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Experimental studies on 1/f noise von Hooge, F N, Kleinpenning, T G M, Vandamme, L K J

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Hall-effect noise in semiconductors von Vaes, H M J, Kleinpenning, T G M

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1/ f noise of deformed crystals von Stroeken, J. T. M., Kleinpenning, T. G. M.

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1/f noise in n-p-n GaAs/AlGaAs heterojunction bipolar transistors : impact of intrinsic transistor and parasitic series resistances von KLEINPENNING, T. G. M, HOLDEN, A. J

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Generation-recombination noise in submicron semiconductor layers: Influence of the edges von Kleinpenning, T. G. M., Jarrix, S., Lecoy, G.

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On 1/ < e1 > f < /e1 > trapping noise in MOSTs von Kleinpenning, T G M

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On 1/f noise and random telegraph noise in very small electronic devices von KLEINPENNING, T. G. M

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Comment on ‘‘Low-frequency excess noise in Nb-Al2O3-Nb Josephson tunnel junctions’’ [Appl. Phys. Lett. 5 0 , 1757 (1987)] von Kleinpenning, T. G. M.

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1/ < e1 > f < /e1 > noise in n-p-n GaAs/AlGaAs heterojunction bipolar transistors:iImpact of intrinsic transistor and parasitic series resistances von Kleinpenning, T G M, Holden, A J

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1/ f noise as a sensitive parameter in the life prediction testing of photovoltaic modules von Kleinpenning, T.G.M., Schurink, F., Van Der Veer, J.H.C.

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On 1/f mobility fluctuations in bipolar transistors von KLEINPENNING, T. G. M

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