A model for ion-irradiation induced hydrogen loss from organic materials von de Jong, M. P., Maas, A. J. H., van Ijzendoorn, L. J., Klein, S. S., de Voigt, M. J. A.

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Scattering of polarized protons by iron and nickel isotopes von Van Hall, P.J., Melssen, J.P.M.G., Wassenaar, S.D., Poppema, O.J., Klein, S.S., Nijgh, G.J.

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Separate determination of concentration profiles for atoms with different masses by simultaneous measurement of scattered projectile and recoil energies von Klein, S.S.

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Study of multistep processes in the reaction 116Sn( [formula omitted], t) 114Sn AT 25.1 MeV von Feix, W.F., Polane, J.H., Van Hall, P.J., Poppema, O.J., Van Oosten, J.M.J., Klein, S.S., Nijgh, G.J.

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Recoil selection by pulse shape discrimination in elastic recoil detection analysis with α-particles (α-ERDA) von Maas, A.J.H., Klein, S.S., Simons, D.P.L., de Voigt, M.J.A.

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Pulse shape discrimination in elastic recoil detection and nuclear reaction analysis von Klein, S.S., Rijken, H.A.

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Focusing in high-resolution time-of-flight elastic recoil detection analysis von Mass, A.J.H., Klein, S.S., Rademakers, F.P., Minnaert, A.W.E., de Voigt, M.J.A.

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Improved depth resolution in CERDA by recoil time of flight measurement von Rijken, H.A., Klein, S.S., de Voigt, M.J.A.

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Elastic recoil selection by pulse shape analysis von Klein, S.S., Rijken, H.A., Tolsma, H.P.T., de Voigt, M.J.A.

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Subnanosecond timing with semiconductor position sensitive detectors von Rijken, H.A., Klein, S.S., de Voigt, M.J.A.

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SmBaCuO films grown at low temperature and pressure von Appelboom, H.M., Matijasevic, V.C., Mathu, F., Rietveld, G., Anczykowski, B., Peterse, W.J.A.M., Tuinstra, F., Mooij, J.E., Sloof, W.G., Rijken, H.A., Klein, S.S., van IJzendoorn, L.J.

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High-resolution elastic recoil depth profiling using alpha-particle beams: CERDA-TOF von Klein, S.S., Rijken, H.A., van Dijk, P.W.L., de Voigt, M.J.A.

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Elastic recoil detection of light elements (C, N, O) with high energy (10–15 MeV) He beams von van IJzendoorn, L.J., Rijken, H.A., Klein, S.S., de Voigt, M.J.A.

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Elastic recoil detection analysis with high energy alpha beams von Rijken, H.A., Klein, S.S., van IJzendoorn, L.J., de Voigt, M.J.A.

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Ion microscopy using magnifying ion TRANSPORT systems and position sensitive detectors von Klein, S.S., Mutsaers, P.H.A.

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Resistivity variations in ion implanted silicon detectors von Rijken, H.A., Klein, S.S., Ligthart, W.C.M., de Voigt, M.J.A., Burger, P.

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Subnanosecond timing with ion-implanted detectors von Rijken, H.A., Klein, S.S., Jacobs, W., Teeuwen, L.J.H.G.W., de Voigt, M.J.A., Burger, P.

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Mass selection and depth profiling by coincident recoil detection for nuclei in the middle mass region von Klein, S.S., Mutsaers, P.H.A., Fischer, B.E.

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The microprobe at the Eindhoven University of Technology von Mutsaers, P.H.A., Los, G., Klein, S.S., De Folter, L.C., De Voigt, M.J.A.

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Improvements of the eindhoven proton microbeam von Mutsaers, P.H.A., Prins, M., Van Der Heide, J.A., Klein, S.S.

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