High growth rate 4H-SiC epitaxial growth using dichlorosilane in a hot-wall CVD reactor von Chowdhury, Iftekhar, Chandrasekhar, M.V.S., Klein, Paul B., Caldwell, Joshua D., Sudarshan, Tangali

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Carrier lifetime variation in thick 4H-SiC epilayers using two-photon absorption von Mahadik, Nadeemullah A., Stahlbush, Robert E., Klein, Paul B., Khachatrian, Ani, Buchner, Stephen, Block, Steven G.

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Cathodoluminescence study of the properties of stacking faults in 4H-SiC homoepitaxial layers von Maximenko, Serguei I., Freitas, Jaime A., Klein, Paul B., Shrivastava, Amitesh, Sudarshan, Tangali S.

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Depth Profiling of Carrier Lifetime in Thick 4H-SiC Epilayers Using Two-Photon Absorption von Klein, Paul B., Mahadik, Nadeemullah A., Khachatrian, Ani, Buchner, Stephen, Stahlbush, Robert E.

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Photoinduced tunability of the reststrahlen band in 4H-SiC von Spann, Bryan T, Compton, Ryan, Ratchford, Daniel, Long, James P, Dunkelberger, Adam D, Klein, Paul B, Giles, Alexander J, Caldwell, Joshua D, Owrutsky, Jeffrey C

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Processing of Cavities in SiC Material for Quantum Technologies von Giles, Alex J., Carter, Sam G., Banks, Hunter B., Daniels, Kevin M., Pavunny, Shojan P., Glaser, Evan R., Luna, Lunet E., Klein, Paul B., Gaskill, D. Kurt, Hobart, Karl D., Kub, Francis J., Myers-Ward, Rachael L., Tadjer, Marko J., Feygelson, Boris N.

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Correlation of Lifetime Mapping of 4H-SiC Epilayers with Structural Defects Using Synchrotron X-Ray Topography von Hosteller, J.L., Klein, Paul B., Guo, J.Q., Dudley, Michael, Goue, O.Y., Gaskill, D. Kurt, Yang, Yu, Raghothamachar, Balaji, Myers-Ward, Rachael L.

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Elimination of Basal Plane Dislocations in Epitaxial 4H-SiC via Multicycle Rapid Thermal Annealing von Tadjer, Marko J., Freitas, Jaime A., Mahadik, Nadeemullah A., Greenlee, Jordan D., Stahlbush, Robert E., Kub, Fritz J., Klein, Paul B., Imhoff, Eugene A., Feigelson, Boris N.

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Single n-GaN microwire/p-Silicon thin film heterojunction light-emitting diode von Ahn, Jaehui, Mastro, Michael A, Klein, Paul B, Hite, Jennifer K, Feigelson, Boris, Eddy, Jr, Charles R, Kim, Jihyun

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CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers von Klein, Paul B., Eddy, Charles R., Freitas, Jaime A., Maximenko, Serguei I., Muzykov, Peter G., Sudarshan, Tangali S., Lew, Kok Keong, Gaskill, D. Kurt, Picard, Yoosuf N., Myers-Ward, Rachael L.

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Temperature Dependence of the Carrier Lifetime in 4H-SiC Epilayers von Klein, Paul B., Eddy, Charles R., VanMil, Brenda L., Shrivastava, Amitesh, Sudarshan, Tangali S., Lew, Kok Keong, Gaskill, D. Kurt, Myers-Ward, Rachael L.

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Impact of 4H-SiC Substrate Defectivity on Epilayer Injected Carrier Lifetimes von Klein, Paul B., Wu, Ping, Eddy, Charles R., VanMil, Brenda L., Liu, Kendrick X., Stahlbush, Robert E., Fatemi, Mohammad, Lew, Kok Keong, Gaskill, D. Kurt, Myers-Ward, Rachael L., Caldwell, Joshua D.

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Long Carrier Lifetimes in n-Type 4H-SiC Epilayers von Klein, Paul B.

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Identification of Defects Limiting the Carrier Lifetime in n- Epitaxial Layers of 4H-SiC von Klein, Paul B.

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Cathodoluminescence study of the properties of stacking faultsin 4 H -SiC homoepitaxial layers von Maximenko, Serguei I., Freitas, Jaime A., Klein, Paul B., Shrivastava, Amitesh, Sudarshan, Tangali S.

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Photoinduced tunability of the reststrahlen band in 4 H − SiC von Spann, Bryan T., Compton, Ryan, Ratchford, Daniel, Long, James P., Dunkelberger, Adam D., Klein, Paul B., Giles, Alexander J., Caldwell, Joshua D., Owrutsky, Jeffrey C.

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Nonequilibrium Carrier Recombination in Highly Excited Bulk SiC Crystals von Jarašiūnas, Kęstutis, Klein, Paul B., Kato, Masashi, Ščajev, Patrik, Gudelis, Vytautas

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Long Carrier Lifetime in 4H-SiC Epilayers Using Chlorinated Precursors von Klein, Paul B., Shrivastava, Amitesh, Sudarshan, Tangali S., Bolotnikov, A.V., Glaser, E.R., Caldwell, Joshua D.

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Variations in the Measured Carrier Lifetimes of n- 4H-SiC Epilayers von Klein, Paul B., Shrivastava, Amitesh, Sudarshan, Tangali S., Caldwell, Joshua D.

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Generation and Recombination Carrier Lifetimes in 4H SiC Epitaxial Wafers von Klein, Paul B., Chung, Gil Yong, Isaacs-Smith, Tamara, Schroder, D.K., Williams, J.W., Loboda, Mark J., Marinella, M.J.

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