Resistance formation mechanisms for contacts to n -GaN and n -AlN with high dislocation density von Sachenko, A. V., Belyaev, A. E., Boltovets, N. S., Zhilyaev, Yu. V., Klad'ko, V. P., Konakova, R. V., Kudryk, Ya. Ya, Panteleev, V. N., Sheremet, V. N.

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Residual Deformations and Mechanical Stresses in Macroporous and Nonporous Silicon Under Normal Etching Conditions von Konin, K. P., Gudymenko, O. Yo, Klad’ko, V. P., Lytvynenko, O. O., Morozovs’ka, D. V.

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In situ photoluminescence Raman study of reversible photo-induced structural transformation of nc-Si von Yukhymchuk, V O, Dzhagan, V M, Valakh, M Ya, Klad'ko, V P, Gudymenko, O J, Yefanov, V S, Zahn, D R T

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Generation and Auto-Revealing of Dislocations in Si During Macropore Etching von Konin, K. P., Gudymenko, O. Yo, Klad’ko, V. P., Lytvynenko, O. O., Morozovs’ka, D. V.

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Asymmetrical reciprocal space mapping using X-ray diffraction: a technique for structural characterization of GaN/AlN superlattices von Stanchu, H. V, Kuchuk, A. V, Barchuk, M, Mazur, Yu. I, Kladko, V. P, Wang, Zh. M, Rafaja, D, Salamo, G. J

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Features of the Temperature Dependence of the Specific Contact Resistance of Au–Ti–Pd–n+–n-Si Diffusion Silicon Structures von Belyaev, A. E., Boltovets, N. S., Klad’ko, V. P., Safryuk-Romanenko, N. V., Lubchenko, A. I., Sheremet, V. N., Shynkarenko, V. V., Slepova, A. S., Pilipenko, V. A., Petlitskaya, T. V., Pilipchuk, A. S., Konakova, R. V., Sachenko, A. V.

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Manganese Clusterization in ZnS:Mn, Mg Synthesized by Self-Propagating High-Temperature Synthesis von Bacherikov, Yu. Yu, Vorona, I. P., Okhrimenko, O. B., Kladko, V. P., Zhuk, A. G., Okulov, S. M., Polishchuk, Yu. O., Gilchuk, A. V., Romanenko, Yu. M., Kidalov, V. V.

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Formation of MgZnO alloy under thermodynamic conditions von Markevich, I.V., Stara, T.R., Kuchuk, A.V., Polishchuk, Yu.O., Kladko, V.P.

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Influence of layer deformation on thermal quenching of exciton photoluminescence in short-period GaAs/AlAs superlattices von Korbutyak, D V, Klad'ko, V P, Krylyuk, S G, Litovchenko, V G, Shalimov, A V, Kuchuk, A V

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X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation von Molodkin, V. B., Olikhovskii, S. I., Len, E. G., Sheludchenko, B. V., Lizunova, S. V., Kyslovs'kyy, Ye. M., Vladimirova, T. P., Kochelab, E. V., Reshetnyk, O. V., Dovganyuk, V. V., Fodchuk, I. M., Lytvynchuk, T. V., Klad'ko, V. P., Świątek, Z.

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Surface reconstruction and optical absorption changes for Ge nanoclusters grown on chemically oxidized Si(1 0 0) surfaces von Lysenko, V S, Kondratenko, S V, Kozyrev, Y N, Kladko, V P, Gomeniuk, Y V, Melnichuk, Y Y, Blanchard, N B

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Calculation of two-dimensional maps of diffuse scattering by a real crystal with microdefects and comparison of results obtained from three-crystal diffractometry von Klad`ko, V P, Datsenko, L I, Bak-Misiuk, J, Olikhovskii, S I, Machulin, V F, Prokopenko, I V, Molodkin, V B, Maksimenko, Z V

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Influence of template type and buffer strain on structural properties of GaN multilayer quantum wells grown by PAMBE, an x-ray study von Kladko, V P, Kuchuk, A V, Safryuk, N V, Machulin, V F, Lytvyn, P M, Raicheva, V G, Belyaev, A E, Mazur, Yu I, Jr, E A DeCuir, Ware, M E, Manasreh, M O, Salamo, G J

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Long-term stability of Ni–silicide ohmic contact to n-type 4H–SiC von Kuchuk, A.V., Guziewicz, M., Ratajczak, R., Wzorek, M., Kladko, V.P., Piotrowska, A.

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Luminescence peculiarities of polyamide-6 α and γ forms von Vasnetsov, M. V., Ponevchinsky, V. V., Plutenko, D. O., Klishevich, G. V., Mitryaev, A. A., Gudymenko, O. I., Kladko, V. P.

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Structure, non-stoichiometry, valence of ions, dielectric and magnetic properties of single-phase Bi0.9La0.1FeO3−δ multiferroics von Pashchenko, A.V., Liedienov, N.A., Li, Quanjun, Tatarchuk, D.D., Turchenko, V.A., Makoed, I.I., Sycheva, V.Ya, Voznyak, A.V., Kladko, V.P., Gudimenko, A.I., Didenko, Y.V., Kozakov, A.T., Levchenko, G.G.

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Effect of structural imperfections on luminescence of ZnCdSe/ZnSe quantum wells von Venger, E.F, Korsunska, N.O, Semenova, G.N, Klad’ko, V.P, Mazin, M.O, Borkovska, L.V, Kushnirenko, V.I, Sadofyev, Yu.G, Kryshtab, T.G, Vidal, M.A, Vargas, I.P

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Control of dielectric properties in bismuth ferrite multiferroic by compacting pressure von Pashchenko, A.V., Liedienov, N.A., Li, Quanjun, Makoed, I.I., Tatarchuk, D.D., Didenko, Y.V., Gudimenko, A.I., Kladko, V.P., Jiang, Lina, Li, Liping, Pogrebnyak, V.G., Levchenko, G.G.

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Microdefects and nonstoichiometry level in GaAs:Si/GaAs films grown by liquid-phase epitaxy method von Klad’ko, V.P, Datsenko, L.I, Zytkiewicz, Z, Bak-Misiuk, J, Maksimenko, Z.V

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Structural and optical studies of strain relaxation in Ge1−xSnx layers grown on Ge/Si(001) by molecular beam epitaxy von Nikolenko, A.S., Strelchuk, V.V., Safriuk, N.V., Kryvyi, S.B., Kladko, V.P., Oberemok, O.S., Borkovska, L.V., Sadofyev, Yu.G.

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