Quantum-mechanical model for phase-contrast imaging of non-crystalline objects von Molodkin, V. B., Velikhovskii, G. O., Lizunova, S. V., Lizunov, V. V., Sheludchenko, B. V., Kislovskii, E. M., Vasilik, Y. V., Skakunova, O. S., Dmitriev, S. V., Fuzik, K. V., Lekhnyak, R. V.

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Quantum‐mechanical model for phase‐contrast imaging of non‐crystalline objects: Ein quantenmechanisches Modell für den Phasenkontrast von nichtkristallinen Proben von Molodkin, V. B., Velikhovskii, G. O., Lizunova, S. V., Lizunov, V. V., Sheludchenko, B. V., Kislovskii, E. M., Vasilik, Y. V., Skakunova, O. S., Dmitriev, S. V., Fuzik, K. V., Lekhnyak, R. V.

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Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films von Skakunova, O. S., Olikhovskii, S. I., Molodkin, V. B., Len, E. G., Kislovskii, E. M., Reshetnyk, O. V., Vladimirova, T. P., Kochelab, E. V., Lizunov, V. V., Lizunova, S. V., Makivs’ka, V. L., Tolmachov, M. G., Skapa, L. M., Vasylyk, Ya. V., Fuzik, K. V.

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Dynamical theory of X-ray diffraction by multilayered structures with microdefects von Molodkin, V. B., Olikhovskii, S. I., Kislovskii, E. N., Fodchuk, I. M., Skakunova, E. S., Pervak, E. V., Molodkin, V. V.

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Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St... von Molodkin, V. B., Olikhovskii, S. I., Skakunova, E. S., Len, E. G., Kislovskii, E. N., Reshetnyk, O. V., Vladimirova, T. P., Lizunov, V. V., Skapa, L. N., Lizunova, S. V., Fuzik, E. V., Tolmachev, N. G., Ostafiychuk, B. K., Pylypiv, V. M., Garpul’, O. Z.

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X-ray diffuse scattering effects from Coulomb-type defects in multilayered structures von Olikhovskii, S. I., Molodkin, V. B., Skakunova, E. S., Kislovskii, E. N., Fodchuk, I. M.

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Combined multiparametric X-ray diffraction diagnostics of microdefects in silicon crystals after irradiation by high-energy electrons von Kislovskii, E. N., Molodkin, V. B., Olikhovskii, S. I., Len, E. G., Sheludchenko, B. V., Lizunova, S. V., Vladimirova, T. P., Kochelab, E. V., Reshetnyk, O. V., Dovganyuk, V. V., Fodchuk, I. M., Lytvynchuk, T. V., Klad’ko, V. P.

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Total integrated intensity of Bragg-diffracted synchrotron radiation for crystals with defects von Baryakhtar, V.G., Kovalchuk, M.V., Litvinov, Yu.M., Molodkin, V.B., Nemoshkalenko, V.V., Olikhovskii, S.I., Kislovskii, E.N., Nizkova, A.I.

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Energy dispersive analysis of total integrated intensity of diffracted synchrotron radiation in monocrystals with defects von Nemoshkalenko, V.V., Molodkin, V.B., Olikhovskii, S.I., Kovalshuk, M.V., Litvinov, Yu.M., Kislovskii, E.N., Nizkova, A.I.

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Structural changes in multilayer systems containing InxGa1-xAs1-yNy quantum wells von Fodchuk, I.M.

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Visualization of X-ray Fourier images of deformation fields for various types of defects in monocrystals von Kislovskii, E.N., Litvinov, Yu.M., Molodkin, V.B., Nemoshkalenko, V.V., Nizkova, A.I., Olikhovskii, S.I., Hudik, N.A., Kovalchuk, M.V.

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Effect of twisting of the diffraction net planes on the integral intensities at Laue diffraction of X-rays in elastically bent silicon crystals von Datsenko, L. I., Kislovskii, E. N., Khrupa, V. I., Shevtsov-Kazmirchuk, K. M.

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