Imaging the atomic structure and local chemistry of platelets in natural type Ia diamond von Olivier, E. J., Neethling, J. H., Kroon, R. E., Naidoo, S. R., Allen, C. S., Sawada, H., van Aken, P. A., Kirkland, A. I.

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Assessing the precision of strain measurements using electron backscatter diffraction – part 1: Detector assessment von Britton, T.B., Jiang, J., Clough, R., Tarleton, E., Kirkland, A.I., Wilkinson, A.J.

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Crystallization of 2H and 4H PbI2 in Carbon Nanotubes of Varying Diameters and Morphologies von Flahaut, E, Sloan, J, Friedrichs, S, Kirkland, A. I, Coleman, K. S, Williams, V. C, Hanson, N, Hutchison, J. L, Green, M. L. H

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Materials Advances through Aberration-Corrected Electron Microscopy von Pennycook, S.J., Varela, M., Hetherington, C.J.D., Kirkland, A.I.

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Assessing the precision of strain measurements using electron backscatter diffraction – Part 2: Experimental demonstration von Britton, T.B., Jiang, J., Clough, R., Tarleton, E., Kirkland, A.I., Wilkinson, A.J.

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Fast deterministic single-exposure coherent diffractive imaging at sub-Ångström resolution von Morgan, A. J., D’Alfonso, A. J., Wang, P., Sawada, H., Kirkland, A. I., Allen, L. J.

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Transformations of gold nanoparticles investigated using variable temperature high-resolution transmission electron microscopy von Young, N.P., van Huis, M.A., Zandbergen, H.W., Xu, H., Kirkland, A.I.

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Discrete Atom Imaging of One-Dimensional Crystals Formed within Single-Walled Carbon Nanotubes von Meyer, Rüdiger R., Sloan, Jeremy, Dunin-Borkowski, Rafal E., Kirkland, Angus I., Novotny, Miles C., Bailey, Sam R., Hutchison, John L., Malcolm L. H. Green

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Recording low and high spatial frequencies in exit wave reconstructions von Haigh, S.J., Jiang, B., Alloyeau, D., Kisielowski, C., Kirkland, A.I.

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A new method for the determination of the wave aberration function for high resolution TEM: 1. Measurement of the symmetric aberrations von Meyer, R.R, Kirkland, A.I, Saxton, W.O

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Characterisation of the Medipix3 detector for 60 and 80 keV electrons von Mir, J.A., Clough, R., MacInnes, R., Gough, C., Plackett, R., Shipsey, I., Sawada, H., MacLaren, I., Ballabriga, R., Maneuski, D., O'Shea, V., McGrouther, D., Kirkland, A.I.

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Phase reconstruction using fast binary 4D STEM data von O'Leary, C. M., Allen, C. S., Huang, C., Kim, J. S., Liberti, E., Nellist, P. D., Kirkland, A. I.

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Aberration measurement using the Ronchigram contrast transfer function von Lupini, A.R., Wang, P., Nellist, P.D., Kirkland, A.I., Pennycook, S.J.

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Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scattering von D’Alfonso, A.J., Cosgriff, E.C., Findlay, S.D., Behan, G., Kirkland, A.I., Nellist, P.D., Allen, L.J.

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Quantifying oxygen distortions in lithium-rich transition-metal-oxide cathodes using ABF STEM von Liberti, E., Lozano, J.G., Pérez Osorio, M.A., Roberts, M.R., Bruce, P.G., Kirkland, A.I.

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Deterministic electron ptychography at atomic resolution von D'Alfonso, A. J., Morgan, A. J., Yan, A. W. C., Wang, P., Sawada, H., Kirkland, A. I., Allen, L. J.

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Optimized conditions for imaging the effects of bonding charge density in electron microscopy von Ciston, J., Kim, J.S., Haigh, S.J., Kirkland, A.I., Marks, L.D.

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Compressed STEM Simulations von Robinson, A. W., Nicholls, D., Wells, J., Moshtaghpour, A., Kirkland, A. I., Browning, N. D.

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On the importance of fifth-order spherical aberration for a fully corrected electron microscope von Chang, L.Y., Kirkland, A.I., Titchmarsh, J.M.

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Wax: A benign hydrogen-storage material that rapidly releases H2-rich gases through microwave-assisted catalytic decomposition von Gonzalez-Cortes, S., Slocombe, D. R., Xiao, T., Aldawsari, A., Yao, B., Kuznetsov, V. L., Liberti, E., Kirkland, A. I., Alkinani, M. S., Al-Megren, H. A., Thomas, J. M., Edwards, P. P.

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