3D effects on 2D resistivity monitoring in earth‐fill dams von Cho, In‐Ky, Ha, Ik‐Soo, Kim, Ki‐Seog, Ahn, Hee‐Yoon, Lee, Seunghee, Kang, Hye‐Jin

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Modeling of [Formula Omitted] Shift in nand Flash-Memory Cell Device Considering Crosstalk and Short-Channel Effects von Jung, Sang-Goo, Lee, Keun-Woo, Kim, Ki-Seog, Shin, Seung-Woo, Lee, Seaung-Suk, Om, Jae-Chul, Bae, Gi-Hyun, Lee, Jong-Ho

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Integrated 3-D stress determination by hydraulic fracturing in multiple inclined boreholes beneath an underground cavern von Synn, Joong-Ho, Park, Chan, Jung, Yong-Bok, Sunwoo, Choon, Kim, Ki-Seog, Choi, Si-Young, Song, Myung-Kyu, Shin, Il-Jae, Rutqvist, Jonny

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Modeling of Vth Shift in NAND Flash-Memory Cell Device Considering Crosstalk and Short-Channel Effects von JUNG, Sang-Goo, LEE, Keun-Woo, KIM, Ki-Seog, SHIN, Seung-Woo, LEE, Seaung-Suk, OM, Jae-Chul, BAE, Gi-Hyun, LEE, Jong-Ho

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Modeling of V Shift in nand Flash-Memory Cell Device Considering Crosstalk and Short-Channel Effects von Jung, Sang-Goo, Lee, Keun-Woo, Kim, Ki-Seog, Shin, Seung-Woo, Lee, Seaung-Suk, Om, Jae-Chul, Bae, Gi-Hyun, Lee, Jong-Ho

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A highly manufacturable integration technology of 20nm generation 64Gb multi-level NAND flash memory von Keun Woo Lee, Se Kyoung Choi, Sung Jae Chung, Hye Lyoung Lee, Su Min Yi, Byeong Il Han, Byung In Lee, Dong Hwan Lee, Ji Hyun Seo, Noh Yong Park, Hae Soo Kim, Hyung Seok Kim, Tae Un Youn, Keum Hwan Noh, Min Kyu Lee, Ju Yeab Lee, Kwang Hee Han, Won Sic Woo, Seok Won Cho, Seung Cheol Lee, Sung Soon Kim, Chan Sun Hyun, Weon Joon Suh, Sang Deok Kim, Myung Kyu Ahn, Hyeon Soo Kim, Ki Seog Kim, Gyu Seog Cho, Sung Kye Park, Aritome, S., Jin Woong Kim, Seok Kiu Lee, Sung Joo Hong, Sung Wook Park

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Decomposition and Super-efficiency in the Korean Life Insurance Industry Employing DEA von Lee, Hyung-Suk, Kim, Ki-Seog

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Optimization of control gate material and structure for enhancing 20nm 64Gb NAND flash reliability von Hae Soo Kim, Kang Jae Lee, Kwang Hee Han, Seok Won Cho, Se Kyoung Choi, Shin Won Seo, Jae Hyun Chung, Keun Woo Lee, Sung Jae Chung, Keum Hwan Noh, Tae Un Youn, Ju Yeab Lee, Min Kyu Lee, Byeong Il Han, Su Min Yi, Ho Seok Lee, Sung Soon Kim, Wan Sup Shin, Kwang Hyun Yun, Min Sung Ko, Jin Kwan Choi, Sang Wan Lee, Sang Deok Kim, Myung Kyu Ahn, Ki Seog Kim, Young Ho Jeon, Sung Kye Park, Aritome, Seiichi, Jin Woong Kim, Sang Sun Lee, Seok Kiu Lee, Kun Ok Ahn, Sung Joo Hong, Gi Hyun Bae, Sung Wook Park

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심부 화강암반의 수리특성 평가를 위한 현장수리시험 비교 및 해석 연구 von 천대성(Dae-Sung Cheon), 석희준(Heejun Suk), 이성곤(Seong Kon Lee), 김태희(Tae-Hee Kim), 김기석(Ki Seog Kim), 전성천(Seong-Chun Jun), 배성호(SeongHo Bae)

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고심도 균열암반대수층 수리지질특성 평가를 위한 정압주입시험 조사절차 및 현장적용사례 연구 von 이항복(Hangbok Lee), 박찬(Chan Park), 박의섭(Eui-Seob Park), 정용복(Yong-Bok Jung), 천대성(Dae-Sung Cheon), 배성호(SeongHo Bae), 김형목(Hyung-Mok Kim), 김기석(Ki Seog Kim)

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한계상태설계법 지반정수 산정을 위한 풍화대 강도특성 측정장치의 개발 및 현장적용에 관한 연구 von 김기석(Ki Seog Kim), 김종훈(Jong Hoon Kim), 최성웅(Sung-oong Choi)

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현장 실험을 통한 암반 탄성파 속도와 암반평가 인자 비교 von 이강녕(Kang Nyeong Lee), 박연준(Yeon Jun Park), 김기석(Ki Seog Kim)

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Noninvasive geotechnical site investigation for stability of Cheomseongdae von Heon-Joon, Park, Derk-Moon, Kim, Ki-Seog, Kim, Hee-Yoon, Ahn, Dong-Soo, Kim

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전단변형 시 안행상 균열의 끝에서 형성되는 새로운 균열 발달 형태 연구: 개별요소적 접근 von 권순달(Soondal Kwon), 유승완(Seungwan You), 권상훈(Sanghoon Kwon), 김기석(Ki-seog Kim)

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사진측량기법에 의한 절리조사 시스템 개발 von 손영진(Youngjin Son), 김재동(Jaedong Kim), 정완순(Wansoon Jeong), 김종훈(Jong-Hoon Kim), 김기석(Ki-Seog Kim)

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Decomposition and Super-efficiency in the Korean Life Insurance Industry Employing DEA von Lee, Hyung-Suk, Kim, Ki-Seog

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국내 화강암의 지반공학적 특성 및 암반분류법과의 상관성에 관한 연구 von 선우춘(Choon Sunwoo), 류동우(Dong-Woo Ryu), 김형목(Hyung-Mok Kim), 김기석(Ki-Seog Kim)

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Modeling of [V_{rm th}] Shift in @@inand@ Flash-Memory Cell Device Considering Crosstalk and Short-Channel Effects von Jung, Sang-Goo, Lee, Keun-Woo, Kim, Ki-Seog, Shin, Seung-Woo, Lee, Seaung-Suk, Om, Jae-Chul, Bae, Gi-Hyun, Lee, Jong-Ho

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RADIATION EVALUATION METHOD OF SEMICONDUCTOR DEVICE USING REFERENCE SEMICONDUCTOR DEVICE, RADIATION EVALUATION SYSTEM OF SEMICONDUCTOR DEVICE, BEAM CHARACTERISTIC EVALUATION METHOD... von SHIN, Seung Han, KHAN, Muhammad Saqib, KIM, Nam Ho, KIM, Young Boo, LEE, Hyeok Jae, CHUNG, Sung Soo, KIM, Ki Seog, KIM, Jie Seok, KIH, Joong Sik

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METHOD FOR EVALUATING RADIATION OF SEMICONDUCTOR DEVICE, AND SYSTEM FOR EVALUATING RADIATION OF SEMICONDUCTOR DEVICE von SHIN, Seung Han, KHAN, Muhammad Saqib, KIM, Nam Ho, KIM, Young Boo, LEE, Hyeok Jae, CHUNG, Sung Soo, KIM, Ki Seog, KIM, Jie Seok, KIH, Joong Sik

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