Uncertainties in the determination of thermal emissivity by measurement of reflectance using Fourier transform spectrometers von van Nijnatten, P.A., Hutchins, M.G., Kilbey, N.B., Roos, A., Gelin, K., Geotti-Bianchini, F., Polato, P., Anderson, C., Olive, F., Köhl, M., Spragg, R., Turner, P.

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