How innovations in methodology offer new prospects for volume electron microscopy von Kievits, Arent J., Lane, Ryan, Carroll, Elizabeth C., Hoogenboom, Jacob P.

Volltext

Optical STEM detection for scanning electron microscopy von Kievits, Arent J., Duinkerken, B.H. Peter, Fermie, Job, Lane, Ryan, Giepmans, Ben N.G., Hoogenboom, Jacob P.

Volltext

Optimizing optical STEM detection for faster acquisition speeds in scanning electron microscopy von Kievits, Arent J., Molnar, Monika, Hoogenboom, Jacob P.

Volltext

FAST-EM array tomography: a workflow for multibeam volume electron microscopy von Kievits, Arent J., Duinkerken, B. H. Peter, Lane, Ryan, de Heus, Cecilia, van Beijeren Bergen en Henegouwen, Daan, Höppener, Tibbe, Wolters, Anouk H. G., Liv, Nalan, Giepmans, Ben N. G., Hoogenboom, Jacob P.

Volltext

Corrigendum to: FAST-EM array tomography: a workflow for multibeam volume electron microscopy von Kievits, Arent J., Duinkerken, B. H. Peter, Lane, Ryan, de Heus, Cecilia, van Beijeren Bergen en Henegouwen, Daan, Höppener, Tibbe, Wolters, Anouk H. G., Liv, Nalan, Giepmans, Ben N. G., Hoogenboom, Jacob P.

Volltext