Single-Shot Imaging of Two-Wavelength Spatial Phase-Shifting Interferometry von Jeon, Jun Woo, Joo, Ki-Nam

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Motionless Polarizing Structured Illumination Microscopy von Park, Hyo Mi, Joo, Ki-Nam

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A compact high-precision periodic-error-free heterodyne interferometer von Joo, Ki-Nam, Clark, Erin, Zhang, Yanqi, Ellis, Jonathan D., Guzmán, Felipe

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Absolute distance measurement by dispersive interferometry using a femtosecond pulse laser von Joo, Ki-Nam, Kim, Seung-Woo

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Distance measurements by combined method based on a femtosecond pulse laser von Joo, Ki-Nam, Kim, Yunseok, Kim, Seung-Woo

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Recent Progress on Optical Tomographic Technology for Measurements and Inspections of Film Structures von Joo, Ki-Nam, Park, Hyo-Mi

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Single Shot Line Profile Measurement of Multi-layered Film Thicknesses von Kim, Jin Sub, Park, Hyo Mi, Joo, Ki-Nam

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Shearing Interferometry: Recent Research Trends and Applications von Joo, Ki-Nam, Park, Hyo Mi

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Surface asymmetry measurements by single-shot cyclic azimuthal shearing interferometry von Joo, Ki-Nam, Park, Hyo Mi

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High resolution heterodyne interferometer without detectable periodic nonlinearity von Joo, Ki-Nam, Ellis, Jonathan D, Buice, Eric S, Spronck, Jo W, Schmidt, Robert H Munnig

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High-speed combined NIR low-coherence interferometry for wafer metrology von Park, Hyo Mi, Joo, Ki-Nam

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Vision chromatic confocal sensor based on a geometrical phase lens von Park, Hyo Mi, Kwon, Uihyeok, Joo, Ki-Nam

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Polarized structured illumination microscopy using polarization gratings for optical sectioning von Cho, Min Seo, Park, Jong-Kyu, Joo, Ki-Nam

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Temporal and Spatial Coherent Pulse Combining by Multi-path Interferometric Scheme von Jang, Jin, Jeong, Hee Won, Joo, Ki-Nam

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Polarized structured illumination microscopy using polarization gratings for optical sectioning: publisher’s note von Cho, Min Seo, Park, Jong-Kyu, Joo, Ki-Nam

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LASIE: Large Area Spectroscopic Imaging Ellipsometry for Characterizing Multi-Layered Film Structures von Kim, Dae Hee, Yun, Young Ho, Joo, Ki-Nam

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Surface figure measurement tool based on a radial shearing interferometer using a geometric phase lens with various spherical wavefronts von Mi Park, Hyo, Joo, Ki-Nam

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Novel combined measurement system to characterize film structures by spectral interferometry and ellipsometry von Yun, Young Ho, Joo, Ki-Nam

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Spherical wavefront measurement on modified cyclic radial shearing interferometry von Bian, Dian, Joo, Ki-Nam, Lu, Yang, Yu, Liandong

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Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laser von JOO, Ki-Nam, KIM, Seung-Woo

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