Helium ion microscope – secondary ion mass spectrometry for geological materials von Ball, Matthew R, Taylor, Richard J M, Einsle, Joshua F, Khanom, Fouzia, Guillermier, Christelle, Harrison, Richard J

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Aloe Vera-Mediated Te Nanostructures: Highly Potent Antibacterial Agents and Moderated Anticancer Effects von Medina-Cruz, David, Vernet-Crua, Ada, Mostafavi, Ebrahim, González, María Ujué, Martínez, Lidia, Iii, A-Andrew D Jones, Kusper, Matthew, Sotelo, Eduardo, Gao, Ming, Geoffrion, Luke D, Shah, Veer, Guisbiers, Grégory, Cholula-Díaz, Jorge L, Guillermier, Christelle, Khanom, Fouzia, Huttel, Yves, García-Martín, José Miguel, Webster, Thomas J

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Neon and helium focused ion beam etching of resist patterns von Xia, Deying, Zhu, Xiaoli, Khanom, Fouzia, Runt, Doug

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NanoFab with SIMS - Recent Results from the BAM-L200 Analytical Standard and Semiconductor Samples von Lewis, Brett, Khanom, Fouzia, Notte, John

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High Resolution Multimodal Chemical Imaging Platform for Organics and Inorganics von Kim, Songkil, Trofimov, Artem, Khanom, Fouzia, Stern, Lewis, Lamberti, William, Colby, Robert, Abmayr, David, Belianinov, Alex, Ovchinnikova, Olga S

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Understanding Microstructural Evolution in ZrC Inoculated Zr 47.5 Cu 45.5 Al 5 Co 2 Via High Resolution SIMS von Lewis, Brett, Rafique, Muhammad Musaddique Ali, Khanom, Fouzia

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Understanding Microstructural Evolution in ZrC Inoculated Zr47.5Cu45.5Al5Co2 Via High Resolution SIMS von Lewis, Brett, Rafique, Muhammad Musaddique Ali, Khanom, Fouzia

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Focused Ne+ Beam for Improved SIMS Analysis of Lithium Ion Batteries von Khanom, Fouzia, Golla-Schindler, U., Bernthaler, Timo, Schneider, Gerhard, Lewis, Brett

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ZEISS ORION NanoFab: New SIMS Spectrometer von Notte, John, Runt, Doug, Khanom, Fouzia, Lewis, Brett, Sijbrandij, Sybren, Guillermier, Christelle, Dowsett, David

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NanoSIMS in Orion NanoFab von Viswanathan, Vignesh, Khanom, Fouzia, Lewis, Brett

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Isotope Effects on H and D Coadsorptions on Si Surfaces von Rahman, Faridur, Ohnishi, Nobuyuki, Khanom, Fouzia, Inanaga, Shoji, Namiki, Akira

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Extremely Low Bias Electron Emitter from Electric Field Induced Reconstructed Tungsten Tip von Faridur Rahman, F.H.M., Khanom, F., Mizuno, S., Tochihara, H.

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NanoFab SIMS: High Spatial Resolution Imaging and Analysis Using Inert-Gas Ion Beams von Sijbrandij, Sybren, Lombardi, Alexander, Sireuil, Alain, Khanom, Fouzia, Lewis, Brett, Guillermier, Christelle, Runt, Doug, Notte, John

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