Contribution to the Physical Modelling of Single Charged Defects Causing the Random Telegraph Noise in Junctionless FinFET von Atamuratov, Atabek E., Khalilloev, Mahkam M., Yusupov, Ahmed, García-Loureiro, A. J., Chedjou, Jean Chamberlain, Kyandoghere, Kyamakya

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Optimization of vertically stacked nanosheet FET immune to self-heating von Balasubbareddy, M., Sivasankaran, K., Atamuratov, Atabek E., Khalilloev, Mahkam M.

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Amplitude of Random Telegraph Noise in Junctionless FinFET with Different Channel Shape von Atamuratov, Atabek E, Khalilloev, Mahkam M, Yusupov, Ahmed, Jean Chamberlain Chedjou, Kyamakya, Kyandoghere

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