On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy von Keyvani, Aliasghar, Sadeghian, Hamed, Goosen, Hans, van Keulen, Fred

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On the modeling of a piezoelectrically actuated microsensor for simultaneous measurement of fluids viscosity and density von Rezazadeh, Ghader, Ghanbari, Mina, Mirzaee, Iraj, Keyvani, Aliasghar

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Real-Time Estimation of the Tip-Sample Interactions in Tapping Mode Atomic Force Microscopy with a Regularized Kalman Filter von Keyvani Janbahan, Aliasghar, Van Der Veen, Gijs, Tamer, Mehmet Selman, Sadeghian, Hamed, Goosen, Hans, Van Keulen, Fred

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Chaos: The speed limiting phenomenon in dynamic atomic force microscopy von Keyvani, Aliasghar, Alijani, Farbod, Sadeghian, Hamed, Maturova, Klara, Goosen, Hans, van Keulen, Fred

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Minimizing tip-sample forces and enhancing sensitivity in atomic force microscopy with dynamically compliant cantilevers von Keyvani, Aliasghar, Sadeghian, Hamed, Tamer, Mehmet Selman, Goosen, Johannes Frans Loodewijk, van Keulen, Fred

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On a MEMS based dynamic remote temperature sensor using transverse vibration of a bi-layer micro-cantilever von Rezazadeh, Ghader, Keyvani, Aliasghar, Jafarmadar, Samad

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A comprehensive model for transient behavior of tapping mode atomic force microscope von Keyvani, Aliasghar, Tamer, Mehmet Selman, van Wingerden, Jan-Willem, Goosen, J. F. L., van Keulen, Fred

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Effects of squeeze film damping on a clamped-clamped beam MEMS filter von Keyvani, Aliasghar, Sadeghi, Morteza H., Rezazadeh, Ghader, Bahrami, Manouchehr

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Effects of Ohmic Resistance on Dynamic Characteristics and Impedance of Micro/Nano Cantilever Beam resonators von Rezazadeh, Ghader, Keyvani, Aliasghar, Sadeghi, Morteza H., Bahrami, Manouchehr

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METHODS AND APPARATUS FOR CHARACTERIZING A SEMICONDUCTOR MANUFACTURING PROCESS von KEYVANI JANBAHAN, Aliasghar, WANG, Jingchao, KLEIN KOERKAMP, Niek Willem, HAUPTMANN, Marc

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METHODS AND APPARATUS FOR CHARACTERIZING A SEMICONDUCTOR MANUFACTURING PROCESS von KEYVANI JANBAHAN, Aliasghar, WANG, Jingchao, KLEIN KOERKAMP, Niek, HAUPTMANN, Marc

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METHODS AND APPARATUS FOR CHARACTERIZING A SEMICONDUCTOR MANUFACTURING PROCESS von KEYVANI JANBAHAN, Aliasghar, WANG, Jingchao, KLEIN KOERKAMP, Niek Willem, HAUPTMANN, Marc

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METHODS OF FITTING MEASUREMENT DATA TO A MODEL AND MODELING A PERFORMANCE PARAMETER DISTRIBUTION AND ASSOCIATED APPARATUSES von KEYVANI JANBAHAN, Aliasghar, WILDENBERG, Jochem Sebastiaan, MOS, Everhardus Cornelis, SPIERING, Frans Reinier

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METHODS AND APPARATUS FOR CHARACTERIZING A SEMICONDUCTOR MANUFACTURING PROCESS von KEYVANI JANBAHAN, Aliasghar, WANG, Jingchao, KLEIN KOERKAMP, Niek, Willem, HAUPTMANN, Marc

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Method of performing surface measurements on a surface of a sample, and scanning probe microscopy system therefore von Keyvani Janbahan, Aliasghar, Sadeghian Marnani, Hamed

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METHODS OF FITTING MEASUREMENT DATA TO A MODEL AND MODELING A PERFORMANCE PARAMETER DISTRIBUTION AND ASSOCIATED APPARATUSES von KEYVANI JANBAHAN, Aliasghar, WILDENBERG, Jochem, MOS, Everhardus, SPIERING, Frans

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METHODS OF FITTING MEASUREMENT DATA TO A MODEL AND MODELING A PERFORMANCE PARAMETER DISTRIBUTION AND ASSOCIATED APPARATUSES von KEYVANI JANBAHAN, Aliasghar, WILDENBERG, Jochem Sebastiaan, SPIERING, Frans Reinier

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METHODS AND APPARATUS FOR CHARACTERIZING A SEMICONDUCTOR MANUFACTURING PROCESS von KEYVANI JANBAHAN, Aliasghar, WANG, Jingchao, KLEIN KOERKAMP, Niek Willem, HAUPTMANN, Marc

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METHODS OF FITTING MEASUREMENT DATA TO A MODEL AND MODELING A PERFORMANCE PARAMETER DISTRIBUTION AND ASSOCIATED APPARATUSES von KEYVANI JANBAHAN, Aliasghar, SPIERING, Frans, Reinier, WILDENBERG, Jochem, Sebastiaan, MOS, Everhardus, Cornelis

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METHOD OF PERFORMING SURFACE MEASUREMENTS ON A SURFACE OF A SAMPLE, AND SCANNING PROBE MICROSCOPY SYSTEM THEREFORE von Keyvani Janbahan, Aliasghar, Sadeghian Marnani, Hamed

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