Detection of compromising radiation from modern data transfer interfaces using the example of high definition multimedia interface von Durakovskiy, A P, Kessarinskiy, L N, Simakhin, E A

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DC–DC's total ionizing dose hardness decrease in passive reserve mode von Kessarinskiy, L.N., Borisov, A.Y., Boychenko, D.V., Nikiforov, A.Y.

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The radiation test based assessment of process quality and reliability for conventional 65-nm CMOS technology von Kessarinskiy, L.N., Davydov, G.G., Boychenko, D.V., Artamonov, A.S., Nikiforov, A.Y., Yashanin, I.B.

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An analysis of the radiation behavior of pulse voltage stabilizers von Kessarinskiy, L. N., Boychenko, D. V., Nikiforov, A. Y.

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Electric regime influence on the DC-DC converters’s hardness to single event transients von Kessarinskiy, L. N., Borisov, A. Y., Boychenko, D. V., Akhmetov, A. O.

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The influence of the electrical conditions on total dose behavior of the analog switches von Boychenko, D. V., Kessarinskiy, L. N., Pechenkina, D. V.

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