Scratchy: A Class of Adaptable Architectures with Software-Managed Communication for Edge Streaming Applications von Faye, Joseph W., Haggui, Naouel, Kermarrec, Florent, Martin, Kevin J. M., Bhattacharyya, Shuvra, Nezan, Jean-François, Pelcat, Maxime

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LiteX: an open-source SoC builder and library based on Migen Python DSL von Kermarrec, Florent, Bourdeauducq, Sébastien, Lann, Jean-Christophe Le, Badier, Hannah

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Towards a Hardware DSL Ecosystem : RubyRTL and Friends von Lann, Jean-Christophe Le, Badier, Hannah, Kermarrec, Florent

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LiteX: an open-source SoC builder and library based on Migen Python DSL von Kermarrec, Florent, Bourdeauducq, Sébastien, Jean-Christophe Le Lann, Badier, Hannah

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Towards a Hardware DSL Ecosystem : RubyRTL and Friends von Jean-Christophe Le Lann, Badier, Hannah, Kermarrec, Florent

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IL-7 receptor influences anti-TNF responsiveness and T cell gut homing in inflammatory bowel disease von Belarif, Lyssia, Danger, Richard, Kermarrec, Laetitia, Nerrière-Daguin, Véronique, Pengam, Sabrina, Durand, Tony, Mary, Caroline, Kerdreux, Elise, Gauttier, Vanessa, Kucik, Aneta, Thepenier, Virginie, Martin, Jerome C, Chang, Christie, Rahman, Adeeb, Guen, Nina Salabert-Le, Braudeau, Cécile, Abidi, Ahmed, David, Grégoire, Malard, Florent, Takoudju, Celine, Martinet, Bernard, Gérard, Nathalie, Neveu, Isabelle, Neunlist, Michel, Coron, Emmanuel, MacDonald, Thomas T, Desreumaux, Pierre, Mai, Hoa-Le, Le Bas-Bernardet, Stephanie, Mosnier, Jean-François, Merad, Miriam, Josien, Régis, Brouard, Sophie, Soulillou, Jean-Paul, Blancho, Gilles, Bourreille, Arnaud, Naveilhan, Philippe, Vanhove, Bernard, Poirier, Nicolas

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On the influence of elastic strain on the accommodation of carbon atoms into substitutional sites in strained Si:C layers grown on Si substrates von Cherkashin, N., Hÿtch, M. J., Houdellier, F., Hüe, F., Paillard, V, Claverie, A., Gouyé, A., Kermarrec, O., Rouchon, D., Burdin, M., Holliger, P.

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Selective growth of tensily strained Si1-yCy films on patterned Si substrates von GOUYE, A, HILE, F, HALIMAOUI, A, KERMARREC, O, CAMPIDELLI, Y, HYTCH, M. J, HOUDELLIER, F, CLAVERIE, A, BENSAHEL, D

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Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si Substrate von Cherkashin, Nikolay, Gouye, Adrien, Hue, Florian, Houdellier, F., Hytch, M. J., Kermarrec, O., Rouchon, D., Burdin, M., Holliger, P., Claverie, Alain

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