Improvements in planar feature reconstructions in atom probe tomography von LARSON, D.J., GEISER, B.P., PROSA, T.J., GERSTL, S.S.A., REINHARD, D.A., KELLY, T.F.

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Atom probe tomography analysis of poly(3-alkylthiophene)s von PROSA, T.J, KEENEY, S. KOSTRNA, KELLY, T.F

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In situ site-specific specimen preparation for atom probe tomography von Thompson, K., Lawrence, D., Larson, D.J., Olson, J.D., Kelly, T.F., Gorman, B.

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My Life as a Microscopist; Two Dual Beams and an Atom Probe von Martens, R.L., Kelly, T.F., Thompson, G.B.

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Encapsulation method for atom probe tomography analysis of nanoparticles von Larson, D.J., Giddings, A.D., Wu, Y., Verheijen, M.A., Prosa, T.J., Roozeboom, F., Rice, K.P., Kessels, W.M.M., Geiser, B.P., Kelly, T.F.

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Atomic scale structure of sputtered metal multilayers von Zhou, X.W., Wadley, H.N.G., Johnson, R.A., Larson, D.J., Tabat, N., Cerezo, A., Petford-Long, A.K., Smith, G.D.W., Clifton, P.H., Martens, R.L., Kelly, T.F.

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Atom Probe Tomography of Reduced Phases in Apollo 16 Regolith Sample 61501,22 von Gopon, P., Spicuzza, M., Kelly, T.F., Reinhard, Prosa, T.J., Larson, D.J., Fournelle, J.

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Removal of Ga Implantation on FIB-prepared Atom Probe Specimens Using Small Beam and Low Energy Ar+ Milling von Bonifacio, C.S., Rice, K.P., Prosa, T.J., Ray, M., Kelly, T.F., Fischione, P.E.

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Focused ion beam fabrication of solidified ferritin into nanoscale volumes for compositional analysis using atom probe tomography von GREENE, M.E., KELLY, T.F., LARSON, D.J., PROSA, T.J.

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Progress in Planar Feature Spatial Reconstruction for Atom Probe Tomography von Geiser, B.P., Larson, D.J., Prosa, T.J., Kelly, T.F.

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Improvements in planar feature reconstructions in atom probe tomography: IMPROVEMENTS IN PLANAR FEATURE RECONSTRUCTIONS von LARSON, D.J., GEISER, B.P., PROSA, T.J., GERSTL, S.S.A., REINHARD, D.A., KELLY, T.F.

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Measurement of Detection Efficiency in Atom Probe Tomography von Prosa, T.J., Geiser, B.P., Ulfig, R.M., Kelly, T.F., Larson, D.J.

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Using Spatial Distribution Maps to Estimate APT Efficiency von Geiser, B.P., Larson, D.J., Prosa, T.J., Kelly, T.F., Ulfig, R.M.

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Application of Atom Probe Tomography to Atomic Layer Deposited Thin Films von Giddings, A.D., Prosa, T.J., Kelly, T.F., Larson, D.J.

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Local Electrode Atom Probes von Kelly, Thomas F, Larson, David J

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Performance Advances in LEAP systems von Ulfig, R.M., Larson, D.J., Kelly, T.F., Clifton, P.H., Prosa, T.J., Lenz, D.R, Oltman, E.X.

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Improved Mass Resolving Power and Yield in Atom Probe Tomography von Larson, D.J., Prosa, T.J., Bunton, J.H., Olson, D.P., Lawrence, D.F., Oltman, E., Strennin, S.N., Kelly, T.F.

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Atom Probe Tomography Analysis of Grain Boundaries in CdTe von Larson, D.J., Reinhard, D.A., Prosa, T.J., Olson, D., Lawrence, D., Clifton, P.H., Ulfig, R.M., Kelly, T.F., Smentkowski, V.S.

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Improving Data Quality in Atom Probe Tomography von Larson, D.J., Prosa, T.J., Lawrence, D., Strennen, S.N., Oltman, E., Martin, I., Reinhard, D.A., Giddings, A. D., Olson, D., Bunton, J.H., Ulfig, R.M, Kelly, T.F., Goodwin, J. R., Martens, R.L.

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Elemental and Isotopic Tomography at Single-Atom-Scale in 4000 and 2400 Ma Zircons von Reinhard, D.A., Valley, J.W., Ushikubo, T., Strickland, A., Snoeyenbos, D., Lawrence, D., Martin, I., Larson, D.J., Kelly, T.F., Cavoise, A.J.

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