The effects of interfacial sub-oxide transition regions and monolayer level nitridation on tunneling currents in silicon devices von Hanyang Yang, Numi, H., Keister, J.W., Lucovsky, G., Rowe, J.E.

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Barrier layer model determined by XPS data for tunneling current reductions at monolayer nitrided Si-SiO2 interfaces von HIRO NIIMI, HANYANG YANG, LUCOVSKY, Gerald, KEISTER, Jeff W, ROWE, Jack E

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The Thermal Decomposition of Ammonium Meta-Vanadate under Restricted Flow Conditions von Brock, Lori R., Keister, Jeff W., France, Michelle, Fierro, Nathan, DeVore, Thomas C.

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Barrier layer model determined by XPS data for tunneling current reductions at monolayer nitrided Si–SiO 2 interfaces von Niimi, Hiro, Yang, Hanyang, Lucovsky, Gerald, Keister, Jeff W, Rowe, Jack E

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