Generalizing Access to Instrumentation Embedded in a Semiconductor Device von Crouch, Al, Laisne, Michael, Keim, Martin

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Cell-Aware Test von Hapke, Friedrich, Redemund, Wilfried, Glowatz, Andreas, Rajski, Janusz, Reese, Michael, Hustava, Marek, Keim, Martin, Schloeffel, Juergen, Fast, Anja

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Multifunctional fuel cell system in an aircraft environment: An investigation focusing on fuel tank inerting and water generation von Keim, Martin, Kallo, Josef, Friedrich, K. Andreas, Werner, Claudia, Saballus, Martin, Gores, Florian

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Special session 9B: Embedded tutorial embedded DfT instrumentation: Design, access, retargeting and case studies von Larsson, Erik

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Embedded DfT Instrumentation: Design, Access, Retargeting and Case Studies von Larsson, Erik, Keim, Martin

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Synovial sarcoma of childhood and adolescence. Report of the german CWS‐81 study von Ladenstein, Ruth, Gadner, Helmut, Treuner, JÖRn, Koscielniak, Eva, d'Oleire, Floriane, Keim, Martin, Niethammer, Dietrich, Jürgens, Herbert, Ritter, Jörg, Schmidt, Dietmar

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Memory built-in self-test with automated multiple step reference trimming von Yun, Jongsin, Keim, Martin

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The introduction of the euro in Estonia von Keim, Martin

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MEMORY BUILT-IN SELF-TEST WITH AUTOMATED MULTIPLE STEP REFERENCE TRIMMING von Yun, Jongsin, Keim, Martin

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MEMORY BUILT-IN SELF-TEST WITH AUTOMATED MULTIPLE STEP REFERENCE TRIMMING von YUN, Jongsin, KEIM, Martin

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MEMORY BUILT-IN SELF-TEST WITH AUTOMATED WRITE TRIM TUNING von NADEAU-DOSTIE, Benoit, YUN, Jongsin, KEIM, Martin

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A METHOD FOR OBTAINING AT LEAST ONE CERAMIC COMPONENT BY JOINING AT LEAST TWO CERAMIC SIC PREFORMS AND CERAMIC COMPONENTS OBTAINED BY SAID METHOD von HETTICH, Pascal, KEIM, Martin, RUDOLF, Jan

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MEMORY BUILT-IN SELF-TEST WITH AUTOMATED MULTIPLE STEP REFERENCE TRIMMING von YUN, Jongsin, KEIM, Martin

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MEMORY BUILT-IN SELF-TEST WITH AUTOMATED REFERENCE TRIM FEEDBACK FOR MEMORY SENSING von NADEAU-DOSTIE, Benoit, YUN, Jongsin, KEIM, Martin

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MEMORY BUILT-IN SELF-TEST WITH AUTOMATED REFERENCE TRIM FEEDBACK FOR MEMORY SENSING von NADEAU-DOSTIE, Benoit, YUN, Jongsin, KEIM, Martin

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Memory built-in self-test with automated reference trim feedback for memory sensing von Yun, Jongsin, Keim, Martin, Nadeau-Dostie, Benoit

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A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis von Keim, M., Tamarapalli, N., Tang, H., Sharma, M., Rajski, J., Schuermyer, C., Benware, B.

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MEMORY BUILT-IN SELF-TEST WITH AUTOMATED REFERENCE TRIM FEEDBACK FOR MEMORY SENSING von Yun, Jongsin, Keim, Martin, Nadeau-Dostie, Benoit

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MEMORY BUILT-IN SELF-TEST WITH ADDRESS SKIPPING TRIM SEARCH von MÜNCH, Christopher, YUN, Jongsin, KEIM, Martin, TAHOORI, Mehdi Baradaran

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Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model von Hillebrecht, S., Polian, I., Engelke, P., Becker, B., Keim, M., Wu-Tung Cheng

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