Two-Term Ritz-Galerkin Solution for the Low Frequency Scattering by a Rectangular Trough in a Soft Ground Plane von Scharstein, R.W., Keen, J.M., Faircloth, D.L.

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Variational Low Frequency Scattering by a Rectangular Trough in a Hard Ground Plane von Scharstein, R.W., Faircloth, D.L., Keen, J.M.

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Applied Computational Fluid Dynamics in Support of Aircraft/Store Compatibility and Weapons Integration von Keen, J.M.

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Nonequilibrium combustion model for fuel-rich gas generators von Foelsche, Robert O, Keen, Joseph M, Solomon, Wayne C, Buckley, Parker L, Corporan, Edwin

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Chemical vapour deposition of metals and metal silicides on the internal surfaces of porous silicon von Anderson, D.G., Anwar, N., Aylett, B.J., Earwaker, L.G., Nasir, M.I., Farr, J.P.G., Stiebahl, K., Keen, J.M.

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Electrical characterisation of oxidised porous silicon von Wu, Z.Y., Hall, S., Eccleston, W., Keen, J.M.

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muanalysis of MOCVD treated porous silicon von Briggs, M.C., Earwaker, L.G., Nasir, M.I., Farr, J.P.G., Keen, J.M., Anderson, D.G., Anwar, N., Aylett, B.J.

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Microanalysis of silicon-on-insulator materials von Earwaker, L.G., Briggs, M.C., Farr, J.P.G., Keen, J.M.

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Porous silicon films: Preparation and examination with surface and optical methods von Hardeman, R.W., Beale, M.I.J., Gasson, D.B., Keen, J.M., Pickering, C., Robbins, D.J.

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Characterisation of thin layers in processed silicon von Earwaker, L.G., Briggs, M.C., Nasir, M.I., Farr, J.P.G., Keen, J.M.

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Analysis of porous silicon silicon-on-insulator materials von Earwaker, L.G., Briggs, M.C., Nasir, M.I., Farr, J.P.G., Keen, J.M.

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High-performance thin-film silicon-on-insulator CMOS transistors in porous anodized silicon von Thomas, N.J., Davis, J.R., Keen, J.M., Castledine, J.G., Brumhead, D., Goulding, M., Alderman, J., Farr, J.P.G., Earwaker, L.G., L'Ecuyer, J., Stirland, I.M., Cole, J.M.

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Analysis of porous silicon von Earwaker, L.G., Farr, J.P.G., Grzeszczyk, P.E., Sturland, I., Keen, J.M.

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A rapid evaluation technique for porous silicon structures von Burch, R., Farr, J.P.G., Keen, J.M., Stiebahl, K.C.

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The Growth of Electrodeposits von Keen, J.M., Farr, J. P. G.

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Porous silicon films: Preparation and examination with surface and optical methods von Hardeman, R.W., Beale, M.I.J., Gasson, D.B., Keen, J.M., Pickering, C., Robbins, D.J.

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A non-destructive optical technique for testing lacquered metal surfaces von Farr, J.P.G., Keen, J.M., Pettitt, M.D.

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The measurement of stress on electrodeposited silver by holographic interferometry von Begh, F.R., Scott, B., Farr, J.P.G., John, H., Loong, C.A., Keen, J.M.

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A Delphi study to determine expert consensus on the behavioural indicators of stress in horses undergoing veterinary care von Pearson, Gemma, Waran, Natalie, Reardon, Richard J.M., Keen, John, Dwyer, Cathy

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Clinimetrics of ultrasound pathologies in osteoarthritis: systematic literature review and meta-analysis von Oo, W.M., Linklater, J.M., Daniel, M., Saarakkala, S., Samuels, J., Conaghan, P.G., Keen, H.I., Deveza, L.A., Hunter, D.J.

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