Productivity improvement focus at White Oak Semiconductor von Karzhavin, Y.

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Plasma-induced charging evaluation using SCA and PDM tools von Karzhavin, Y., Lao, K.Q., Wu, W., Gelatos, C.

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Method for neutral spectra analysis taking ripple‐trapped particle losses into account von Dnestrovskij, A. Yu, Bengtson, Roger D., Karzhavin, Yuri, Ouroua, A.

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H-mode development in TEXT-U limiter plasmas von Roberts, D R, Bravenec, R V, Bengtson, R D, Brower, D L, Cima, G, Crowley, T P, Darbar, A, Edmonds, P H, Gasquet, H, Gentle, K W, Hallock, G A, Heard, J W, Hurwitz, P D, Jiang, Y, Karzhavin, Y Y, Lierzer, J, Nikitin, A, Ouroua, A, Patterson, D M, Phillips, P E, Reedy, S, Richards, B, Rowan, W L, Schoch, P M, Sing, D C, Solano, E R, Storek, D, Watts, C, Winslow, D, Wootton, A J, Zeng, L, Zhang, B, Zheng, S-B

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Initial results from a charge exchange q diagnostic on TEXT‐U von Valanju, P. M., Duraiappah, L., Bengtson, Roger D., Karzhavin, Y., Nikitin, A.

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Optical measurements of core density fluctuations in TEXT‐U using a helium metastable beam von Durst, R. D., Denhartog, E. A., Fonck, R. J., Kim, J. S., Karzhavin, Y.

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Lower rate of H super(+)(OH super(-)) ions generation at an anion-exchange membrane in electrodialysis von Pismenskaya, N D, Belova, E I, Nikonenko, V V, Zabolotsky, VI, Lopatkova, G Y, Karzhavin, Y N, Larchet, C

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Tungsten silicide gate stack optimization for 170-nm DRAM technology von Rao, V., Morgan, J., Hoesler, W., Barden, J., Karzhavin, Y., Van Holt, P., Petter, R., Ollendorf, H., Christensen, K., Ricks, D.

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Shallow trench isolation etch process for 0.2 /spl mu/m trench capacitor DRAM technology von Karzhavin, Y.

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Plasma induced charging and physical damage after dry etch processing von Karzhavin, Y., Wu, W.

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Overview of plasma induced damage after dry etch processing von Karzhavin, Y., Wu, W.

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Plasma induced charging damage and oxide degradation after dry etch processing von Karzhavin, Y., Wu, W.

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Plasma Induced Charging Evaluation Using SCA And PDM Tools von Karzhavin, Y., Lao, K., Wei Wu, Gelatos, C.

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Equipment productivity improvement via inline qualification implementation von Lafferty, N., Fiol, B., Jowett, P., Karzhavin, Y., Urenda, T.

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Initial results from a charge exchange [ital q] diagnostic on TEXT-U von Valanju, P.M., Duraiappah, L., Bengtson, R.D., Karzhavin, Y., Nikitin, A.

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Power deposition profile effect on the ECH efficiency in T-10 von Alikaev, V, Bagdasarov, A, Berezovskii, E, Berlizov, A, Borshchagovskii, A, Yasin, N, Vershkov, V, Gorelov, Yu, Grashin, S, Dremin, M, Esipchuk, Yu, Efremov, S, Zaveryaev, V, Il'in, V, Kislov, A, Karzhavin, Yu, Markelov, V, Maximov, Yu, Medvedev, A, Notkin, G, Nabatov, A, Pimenov, A, Popovichev, S, Popov, I, Poznyak, V, Razumova, K, Roy, I, Rodichkin, I, Stepanenko, M, Strelkov, V, Sokolov, Yu, Sitar, E, Solntsev, A, Tarakanov, A, Tarasan, K, Titishov, K, Trukhin, V, Phlyagin, V, Chankin, A, Chistyakov, V, Chicherov, V, Shishkin, B, Yaramyshev, G

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On-line monitoring of the BCDMS spectrometer performance von Deiters, K., Fournier, J.P., Karzhavin, V.Y., Kazarinov, M.Y., Michau, J.C., Renardy, J.F., Staude, A., Strachota, J., Teichert, K.M.

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Study of two types of T-10 regimes with ECRH and Ohmic heating von Alikaev, V V, Bagdasarov, A A, Berezovsky, E L, Bobrovskii, G A, Vasin, N L, Vershkov, V A, Grashin, S A, Dremin, M M, Esipchuk, U V, Efremov, S L, Kislov, A Ya, Karzhavin, Yu Yu, Medvedev, A A, Notkin, G E, Pimenov, A B, Razumova, K A, Savrukhin, P V, Stepanenko, M M, Titishov, K B, Trukhin, V M, Chankin, A V, Miroshnikov, I V

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Method for forming a semiconductor device von KELLY, PATRICK MICHAEL, KARZHAVIN, YURI Y, LAO, KEITH Q

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An upgraded configuration of a high-luminosity spectrometer for deep-inelastic muon scattering experiments von Benvenuti, A.C., Bollini, D., Bruni, G., Camporesi, T., Heiman, G., Laurenti, G., Monari, L., Navarria, F.L., Argento, A., Birr, W., Deiters, K., Goossens, M., Nanni, F., Piemontese, L., Staude, A., Golutvin, I.A., Karzhavin, V.Y., Kazarinov, M.Y., Khabarov, V.S., Kiryushin, Y.T., Kisselev, V.S., Savin, I.A., Smirnov, G.I., Smolin, D.A., Strachota, J., Sultanov, G., Todorov, P., Veress, I., Volodka, A.G., Zarubin, A.V., Jamnik, D., Kopp, R., Meyer-Berkhout, U., Teichert, K.M., Tirler, R., Voss, R., Zupančič, Č., Cribier, M., Feltesse, J., Fournier, J.P., Michau, J.C., Milsztajn, A., Ouraou, A., Renardy, J.F., Rich-Hennion, P., Rothan, B., Sacquin, Y., Smadja, G., Verrecchia, P., Virchaux, M.

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