AdaBalGAN: An Improved Generative Adversarial Network With Imbalanced Learning for Wafer Defective Pattern Recognition von Wang, Junliang, Yang, Zhengliang, Zhang, Jie, Zhang, Qihua, Chien, Wei-Ting Kary

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Fast Semiconductor Reliability Assessments Using SPRT von Chien, Wei-Ting Kary, Chung, Andrew, Kuo, Way

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Apply DFT Integrated Enhanced EBAC Methodology on Defect Isolations von Kary Chien, Wei-Ting, Lester Yin, Yuanzi

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Statistical Process Control for Monitoring the Particles With Excess Zero Counts in Semiconductor Manufacturing von Tian, Wenxing, You, Hailong, Zhang, Chunfu, Kang, Sheng, Jia, Xinzhang, Chien, Wei-Ting Kary

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THE TEST-TO-TARGET METHODOLOGIES FOR THE RISK ASSESSMENT OF SEMICONDUCTOR RELIABILITY von KARY CHIEN, WEI-TING, ATMAN, ZHAO YONG, CHANG, VENSON, WU, JEFF

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Reliability Baseline Management and Applications in Semiconductor Manufacturing von Chien, Wei-Ting Kary, Zhao, Yong Atman, Zhang, Mark, Li, Ming

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A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing von Wei-Ting Kary Chien, Yang, S.F.

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A Study On The Dielectric Intrinsic Breakdown Specification von Han, Kun, Zhao, Yong A., Guo, Qiang, Chien, Wei-Ting Kary

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Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies von Chien, Wei-Ting Kary, Zhao, Yong Atman, Zhang, Liwen, Wang, Zhijuan

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Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests von Chien, Wei-Ting Kary, Zhao, Yong Atman, Zhu, Yueqin, Song, Yongliang

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Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index von Yang, Siyuan Frank, Chien, Wei-Ting Kary

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Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs von Chien, Wei-Ting Kary, Li, Ming

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A cost-effective wafer-level reliability test system for integrated circuit makers von Tseng, Summer Fan-Chung, Chien, Wei-Ting Kary, Gong, Excimer, Cai, Bing-Chu

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A nonparametric approach to estimate system burn-in time von KARY CHIEN, W.-T, KUO, W

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Burn-in effect on yield von Kim, Taeho, Kuo, Way, Chien, Wei-Ting Kary

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A Practical, Innovative Method for Electro-Static Discharge Data Analysis von Chien, Wei-Ting Kary, Yang, Siyuan Frank

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Predict VLSI Circuit Reliability Risks Using Neural Network von Kary Chien, Wei-Ting, Kang, Randy, Sii, Howking, Li, Ming

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Use of the dirichlet process for reliability analysis von Kary Chien, Wei-Ting, Kuo, Way

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A Study on Average-Range G.R.R Method Application on Wafer Field Metrology von Cao, Yan, Gong, Tai. Cheng, Yu, Yan. Ju, Chang, Kai. Yuan, Chien, Wei. Ting

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Burn-in effect on yield von Kim, Taeho, Kuo, Way, Chien, Wei-Ting Kary

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