The Application Procedure of Seprafilm in Alexis Wound Retractor Laparoscopic Ultraminilaparotomy Myomectomy V.S Total Laparoscopic Myomectomy von Chuang, Y-C, Ho, S-Y, Kan, Y.Y

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Evidence for a link between the experiential allocation of saccade preparation and visuospatial attention von Kan, Janis Y Y, Niel, Ullanda, Dorris, Michael C

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Large Cell Neuroendocrine Carcinoma of the Uterine Cervix von Liou, W.S., Sun, C.H., Lo, Y.S., Kan, Y.Y.

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Endometrioid Adenocarcinoma Arising From Uterine Adenomyosis Involving The Rectosigmoid Colon: Report Of An Unusual Case von Liou, W.S., Sun, C.H., Hsieh, P.P., Kan, Y.Y.

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EClass: An execution classification approach to improving the energy-efficiency of software via machine learning von Kan, Edward Y.Y., Chan, W.K., Tse, T.H.

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Single beam determination of porosity and etch rate in situ during etching of porous silicon von Foss, S. E., Kan, P. Y. Y., Finstad, T. G.

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Oxidation of macroporous silicon for thick thermal insulation von Kan, P.Y.Y., Finstad, T.G.

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Bi-stable pore size during electrochemical etching of n-type silicon during a thermal ramp von Kan, P.Y.Y., Finstad, T.G.

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A scoring system for predicting recurrence of cervical cancer von NG, H. T., SHYU, S. K., YUAN, C. C., CHEN, Y. K., CHAO, K. C., KAN, Y. Y.

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One-step etch-through porous silicon membrane with an open cavity and pore size tuning von Kan, P. Y. Y., Finstad, T. G.

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Thick etch-through macroporous Si membrane from p- and n-Si, and fast pore etching and tuning the pore size from n-Si von Kan, P.Y.Y., Foss, S.E., Finstad, T.G.

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An investigation of an etch-through process on porous silicon von Kan, P. Y. Y., Finstad, T. G.

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High resolution deep level transient spectroscopy studies of the vacancy-oxygen and related defects in ion-implanted silicon von Evans-Freeman, J. H., Kan, P. Y. Y., Abdelgader, N.

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The effect of etching with glycerol, and the interferometric measurements on the interface roughness of porous silicon von Kan, P. Y. Y., Foss, S. E., Finstad, T. G.

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Characterisation of Cryptosporidium parvum von Homan, W.I., Kan, Y.Y., Heppener, J., van Gorkom, T.

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Porous Silicon for Chip Cooling Applications von Kan, P Y Y, Finstad, T G, Kristiansen, H, Foss, S E

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High resolution Laplace DLTS studies of defects in ion-implanted silicon von Evans-Freeman, J.H, Abdelgader, N, Kan, P.Y.Y, Peaker, A.R

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Hydrogen reactions with electron irradiation damage in silicon von Peaker, A.R, Evans-Freeman, J.H, Kan, P.Y.Y, Rubaldo, L, Hawkins, I.D, Vernon-Parry, K.D, Dobaczewski, L

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Vacancy-related defects in ion implanted and electron irradiated silicon von PEAKER, A. R, EVANS-FREEMAN, J. H, KAN, P. Y. Y, HAWKINS, I. D, TERRY, J, JEYNES, C, RUBALDO, L

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High resolution DLTS of hydrogen reactions with defects in erbium-implanted silicon von Kan, P.Y.Y., Abd El-Rahman, K.F., Abdelgader, N., Evans-Freeman, J.H., Peaker, A.R.

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