Copper slag: optimization of productivity and consumption for cleaner production in dry abrasive blasting von Kambham, K., Sangameswaran, S., Datar, S.R., Kura, B.

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In-situ observation of non-hemispherical tip shape formation during laser-assisted atom probe tomography von Koelling, S., Innocenti, N., Schulze, A., Gilbert, M., Kambham, A. K., Vandervorst, W.

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Atom probe analysis of a 3D finFET with high- k metal gate von Gilbert, M., Vandervorst, W., Koelling, S., Kambham, A.K.

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Atom-probe for FinFET dopant characterization von Kambham, A.K., Mody, J., Gilbert, M., Koelling, S., Vandervorst, W.

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Characteristics of cross-sectional atom probe analysis on semiconductor structures von Koelling, S., Innocenti, N., Hellings, G., Gilbert, M., Kambham, A.K., De Meyer, K., Vandervorst, W.

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Total PM Emission Factors for Steel Grit Used in Dry Abrasive Blasting von Kura, B, Sangameswaran, S, Kambham, K, Silvadasan, X

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Electrophoretic Repair of Impoundment Leaks:  Analysis and Verification with Experimental Data von Corapcioglu, M. Yavuz, Kambham, Kiran K. R, Tuncay, Kagan

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Self-Weight Subsidence of Saturated Soft Porous Media von Tuncay, Kagan, Kambham, Kiran K. R, Corapcioglu, M. Yavuz

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Can Contaminant Transport Models Predict Breakthrough? von Peng, Wei-Shyuan "Stone", Hampton, Duane R., Konikow, Leonard F., Kambham, Kiran, Benegar, Jeffrey J.

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Total PM Emisioin Factors for Steel Grit Used in Dry Abrasive Blasting von Kura, B, Sangameswaran, S, Kambham, K, Silvadasan, X

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Atom Probe Tomography for 3D-dopant analysis in FinFET devices von Kambham, A. K., Zschaetzsch, G., Sasaki, Y., Togo, M., Horiguchi, N., Mody, J., Florakis, A., Gajula, D. R., Kumar, A., Gilbert, M., Vandervorst, W.

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Clean Technologies Center At The University Of New Orleans von Kura, B, Sangameswaran, S, Kambham, K

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Dopant and carrier profiling for 3D-device architectures von Mody, J., Kambham, A. K., Zschatzsch, G., Chiarella, T., Collaert, N., Witters, L., Eyben, P., Gilbert, M., Kolling, S., Schulze, A., Hoffmann, T., Vandervorst, W.

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High performance n-MOS finFET by damage-free, conformal extension doping von Zschatzsch, G., Sasaki, Y., Hayashi, S., Togo, M., Chiarella, T., Kambham, A. K., Mody, J., Douhard, B., Horiguchi, N., Mizuno, B., Ogura, M., Vandervorst, W.

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Dopant and carrier profiling in FinFET-based devices with sub-nanometer resolution von Mody, J., Kambham, A.K., Zschatzsch, G., Schatzer, P., Chiarella, T., Collaert, N., Witters, L., Jurczak, M., Horiguchi, N., Gilbert, M., Eyben, P., Kolling, S, Schulze, A., Hoffmann, T-Y., Vandervorst, W.

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Sidestream Cigarette Smoke: A Low Cost Monitoring System To Evaluate PM10 And PM2.5 Emission Factors von Kura, B, Weatherton, Y, Naoum, E, Kambham, K, S. Sangameswaran 1

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Analytical expressions to estimate the free product recovery in oil-contaminated aquifers von Corapcioglu, M. Yavuz, Tuncay, Kagan, Lingarn, Rajasekhar, Kambham, Kiran K. R.

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A Semianalytical Analysis of Compressible Electrophoretic Cake Formation von Kambham, Kiran K. R., Tuncay, Kagan, Corapcioglu, M. Yavuz

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Abscisic Acid and Abiotic Stress Tolerance in Crop Plants von Sah, Saroj K, Reddy, Kambham R, Li, Jiaxu

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3D-carrier profiling in FinFETs using scanning spreading resistance microscopy von Mody, J., Zschatzsch, G., Kolling, S., De Keersgieter, A., Eneman, G., Kambham, A. K., Drijbooms, C., Schulze, A., Chiarella, T., Horiguchi, N., Hoffmann, T-Y, Eyben, P., Vandervorst, W.

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