XID: Don't care identification of test patterns for combinational circuits von Miyase, K., Kajihara, S.

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On low-capture-power test generation for scan testing von Xiaoqing Wen, Yamashita, Y., Kajihara, S., Laung-Terng Wang, Saluja, K.K., Kinoshita, K.

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Implication of hrpW in virulence of Pseudomonas cichorii von Kajihara, S., Hojo, H., Koyanagi, M., Tanaka, M, Mizumoto, H., Ohnishi, K., Kiba, A., Hikichi, Y.

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Nitrogen and potential n-type dopants in diamond von KAJIHARA, S. A, ANTONELLI, A, BERNHOLC, J

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Improvement of photovoltages in organic dye-sensitized solar cells by Li intercalation in particulate TiO2 electrodes von Harima, Y., Kawabuchi, K., Kajihara, S., Ishii, A., Ooyama, Y., Takeda, K.

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Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits von Kajihara, S., Pomeranz, I., Kinoshita, K., Reddy, S.M.

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Structural properties of the red-color overglaze for the HIZEN porcelains produced in the early Edo period of Japan von Hidaka, M., Ohashi, K., Kajihara, S., Wijesundera, R.P., Kumara, L.S.R., Choi, Jae-Young, Sung, Nark Eon

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On pinpoint capture power management in at-speed scan test generation von Wen, X., Nishida, Y., Miyase, K., Kajihara, S., Girard, P., Tehranipoor, M., Wang, L-T

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Involvement of the Ets-1 gene in overexpression of matrilysin in human hepatocellular carcinoma von OZAKI, Iwata, MIZUTA, Toshihiko, GANG ZHAO, YOTSUMOTO, Hiroaki, HARA, Toshiya, KAJIHARA, Susumu, HISATOMI, Akitaka, SAKAI, Takahiro, YAMAMOTO, Kyosuke

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Power-aware test generation with guaranteed launch safety for at-speed scan testing von Wen, X, Enokimoto, K, Miyase, K, Yamato, Y, Kochte, M A, Kajihara, S, Girard, P, Tehranipoor, M

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On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression von Enokimoto, K., Xiaoqing Wen, Miyase, K., Jiun-Lang Huang, Kajihara, S., Laung-Terng Wang

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Correlation between the Izumiyama porcelain ceramics and the red-overglaze enamels of the Kakiemon-style porcelains von Kajihara, S., Hidaka, M., Wijesundera, R.P., Kumara, L.S.R., Koga, M., Kobayashi, S., Tsuru, T., Koga, K., Shimomura, K., Choi, Jae-Young, Sung, Nark Eon, Park, Young Jun

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CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing von Furukawa, H., Wen, X., Miyase, K., Yamato, Y., Kajihara, S., Girard, P., Wang, L.-T., Tehranipoor, M.

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Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling von Miyase, K., Uchinodan, Y., Enokimoto, K., Yamato, Y., Wen, X., Kajihara, S., Wu, F., Dilillo, L., Bosio, A., Girard, P., Virazel, A.

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Optimal scan tree construction with test vector modification for test compression von Miyase, Kajihara

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CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing von Enokimoto, K., Wen, X., Yamato, Y., Miyase, K., Sone, H., Kajihara, S., Aso, M., Furukawa, H.

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Differential expression of laminin receptors in human hepatocellular carcinoma von Ozaki, I, Yamamoto, K, Mizuta, T, Kajihara, S, Fukushima, N, Setoguchi, Y, Morito, F, Sakai, T

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Density of thermal vacancies in γ-Ti–Al–M, M=Si, Cr, Nb, Mo, Ta or W von Woodward, C, Kajihara, S

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On test data volume reduction for multiple scan chain designs von Reddy, S.M., Miyase, K., Kajihara, S., Pomeranz, I.

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Test vector modification for power reduction during scan testing von Kajihara, S., Ishida, K., Miyase, K.

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