Low-Frequency Noise Characteristics of In-Doped ZnO Ultraviolet Photodetectors von Chang, Shoou-Jinn, Duan, Bi-Gui, Hsiao, Chih-Hung, Young, Sheng-Joue, Wang, Bo-Chin, Kao, Tsung-Hsien, Tsai, Kai-Shiang, Wu, San-Lein

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Noise Properties of Low-Temperature-Grown Co-Doped ZnO Nanorods as Ultraviolet Photodetectors von Liu, Chung-Wei, Chang, Shoou-Jinn, Hsiao, Chih-Hung, Lo, Kuang-Yao, Kao, Tsung-Hsien, Wang, Bo-Chin, Young, Sheng-Joue, Tsai, Kai-Shiang, Wu, San-Lein

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Impact of SiGe source/drain induced-compressive strain on low frequency noise in high-k/metal gate p-channel metal-oxide-semiconductor transistors von Lein Wu, San, Tsai, Kai-Shiang, Cheng, Osbert

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ZnO-Based Ultraviolet Photodetectors With Novel Nanosheet Structures von Young, Sheng-Joue, Liu, Yi-Hsing, Hsiao, Chih-Hung, Chang, Shoou-Jinn, Wang, Bo-Chin, Kao, Tsung-Hsien, Tsai, Kai-Shiang, Wu, San-Lein

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Noise Properties of Fe-ZnO Nanorod Ultraviolet Photodetectors von Chang, Shoou-Jinn, Liu, Chung-Wei, Hsiao, Chih-Hung, Lo, Kuang-Yao, Young, Sheng-Joue, Kao, Tsung-Hsien, Tsai, Kai-Shiang, Wu, San-Lein

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Impact of Uniaxial Strain on Random Telegraph Noise in High- k /Metal Gate pMOSFETs von Po-Chin Huang, Chen, Jone F., Tsai, Shih Chang, San Lein Wu, Kai-Shiang Tsai, Tsung Hsien Kao, Yean-Kuen Fang, Chien-Ming Lai, Chia-Wei Hsu, Yi-Wen Chen, Cheng, Osbert

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Low-Frequency Noise Spectra of Laterally Bridged ZnO Microrod-Based Photodetectors von Chuang, Ming-Yueh, Yu, Hsin-Chieh, Su, Yan-Kuin, Hsiao, Chih-Hung, Kao, Tsung-Hsien, Tsai, Kai-Shiang, Huang, Chien-Sheng, Huang, Yu-Chun, Wu, San-Lein

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Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain von Lo, Kun-Yuan, Cheng, Osbert, Fang, Yean-Kuen, Yang, Chih-Wei, Kao, Tsung-Hsien, Tsai, Kai-Shiang, Huang, Po Chin, Wang, Bo-Chin, Chen, Jone-Fang, Wu, San-Lein, Tsai, Shih-Chang, Chen, Cheng-Guo

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Investigation of Trap Properties in High-$k$/Metal Gate p-Type Metal--Oxide--Semiconductor Field-Effect Transistors with SiGe Source/Drain Using Random Telegraph Noise Analysis von Wu, San-Lein, Tsai, Kai-Shiang, Cheng, Osbert

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HDWT-based grayscale watermark for copyright protection von Yen, Ester, Tsai, Kai-Shiang

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Trap properties of high-k/metal gate pMOSFETs with aluminum ion implantation by random telegraph noise and 1/f noise measurements von Kao, Tsung-Hsien, Wu, San-Lein, Tsai, Kai-Shiang, Fang, Yean-Kuen, Lai, Chien-Ming, Hsu, Chia-Wei, Chen, Yi-Wen, Cheng, Osbert, Chang, Shoou-Jinn

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Investigation of trap properties of Hf0.83Zr0.17O2 high-k gate stack p-type MOSFETs by low-frequency (1/f) noise and random telegraph noise analyses von Tsai, Shih-Chang, Wu, San-Lein, Huang, Po-Chin, Wang, Bo-Chin, Tsai, Kai-Shiang, Kao, Tsung-Hsien, Yang, Chih-Wei, Chen, Cheng-Guo, Cheng, Osbert, Fang, Yean-Kuen, Chang, Shoou-Jinn, Chen, Jone-Fang

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Investigation of trap properties of Hf 0.83 Zr 0.17 O 2 high- k gate stack p-type MOSFETs by low-frequency (1/ f ) noise and random telegraph noise analyses von Tsai, Shih-Chang, Wu, San-Lein, Huang, Po-Chin, Wang, Bo-Chin, Tsai, Kai-Shiang, Kao, Tsung-Hsien, Yang, Chih-Wei, Chen, Cheng-Guo, Cheng, Osbert, Fang, Yean-Kuen, Chang, Shoou-Jinn, Chen, Jone-Fang

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Investigation of trap properties of Hf sub(0.83)Zr sub(0.17)O sub(2) high-k gate stack p-type MOSFETs by low-frequency (1/f) noise and random telegraph noise analyses von Tsai, Shih-Chang, Wu, San-Lein, Huang, Po-Chin, Wang, Bo-Chin, Tsai, Kai-Shiang, Kao, Tsung-Hsien, Yang, Chih-Wei, Chen, Cheng-Guo, Cheng, Osbert, Fang, Yean-Kuen, Chang, Shoou-Jinn, Chen, Jone-Fang

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Hyperspectral Image Classification Using Fast and Adaptive Bidimensional Empirical Mode Decomposition With Minimum Noise Fraction von Yang, Ming-Der, Huang, Kai-Shiang, Yang, Yeh Fen, Lu, Liang-You, Feng, Zheng-Yi, Tsai, Hui Ping

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THERMALLY STABLE COPPER-ALLOY ADHESION LAYER FOR METAL INTERCONNECT STRUCTURE AND METHOD FOR FORMING THE SAME von CHEN CHUN-SHENG, TSAI JENG-LUEN, SU HUNG-WEN, WENG CHENG-HUI, KUO KAI-SHIANG, LIU JEN-WEI, RIN SHUNKETSU, HSIEH HUEI-WEN

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Image obtaining method von Gan, Kai-Shiang, Huang, Wei-Shiang, Tenn, Hian-Kun, Kao, Tsai-Ling

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THERMALLY STABLE COPPER-ALLOY ADHESION LAYER FOR METAL INTERCONNECT STRUCTURES AND METHODS FOR FORMING THE SAME von LIN, Chun-Chien, WENG, Cheng-Hui, SU, Hung-Wen, CHEN, Chun-Sheng, TSAI, Cheng-Lun, KUO, Kai-Shiang, LIU, Jen-Wei, HSIEH, Huei-Wen

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Thermally stable copper-alloy adhesion layer for metal interconnect structures and methods for forming the same von Kuo, Kai-Shiang, Lin, Chun-Chieh, Su, Hung-Wen, Hsieh, Huei-Wen, Liu, Jen-Wei, Tsai, Cheng-Lun, Chen, Chun-Sheng, Weng, Cheng-Hui

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IMAGE OBTAINING METHOD von KAO, Tsai-Ling, HUANG, Wei-Shiang, TENN, Hian-Kun, GAN, Kai-Shiang

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