A comparison of cleaning procedures for removing potassium from wafers exposed to KOH von Aslam, M., Artz, B.E., Kaberline, S.L., Prater, T.J.

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Simplex pattern recognition applied to carbon-13 nuclear magnetic resonance spectrometry von Brunner, Thomas R, Wilkins, Charles L, Lam, T. Fai, Soltzberg, Leonard J, Kaberline, Steven L

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Large-scale mass spectral analysis by simplex pattern recognition von Lam, T. Fai, Wilkins, Charles L, Brunner, Thomas R, Soltzberg, Leonard J, Kaberline, Steven L

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Evaluation and comparison of pattern classifiers for chemical applications von Soltzberg, Leonard J, Wilkins, Charles L, Kaberline, Steven L, Lam, T. Fai, Brunner, Thomas R

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Evaluation and comparison of pattern classifiers for chemical applications: adaptive digital learning networks and linear discriminants von Soltzberg, Leonard J, Wilkins, Charles L, Kaberline, Steven L, Lam, T. Fai, Brunner, T. L

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Evaluation of the super-modified simplex for use in chemical pattern recognition von Kaberline, Steven L., Wilkins, Charles L.

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Composition of Clusters Formed by Plasma Discharge in Simulated Engine Exhaust von Hoard, John, Bretz, Richard L., Kaberline, Steven, Haack, Larry P., Kalashnikov, Eugenii

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