Assessment of photooxidation in multi-layer coating systems by time-of-flight secondary ion mass spectrometry von Gerlock, J.L., Prater, T.J., Kaberline, S.L., deVries, J.E.

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18O− time-of-flight secondary ion mass spectrometry technique to map the relative photooxidation resistance of automotive paint systems von Gerlock, J.L, Prater, T.J, Kaberline, S.L, Dupuie, J.L, Blais, E.J, Rardon, D.E

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A comparison of cleaning procedures for removing potassium from wafers exposed to KOH von Aslam, M., Artz, B.E., Kaberline, S.L., Prater, T.J.

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Characterization of interfacial chemistries associated with polymer systems by spatially resolved surface analytical methodologies von deVries, J.E., Haack, L.P., Prater, T.J., Kaberline, S.L., Gerlock, J.L., Holubka, J.W., Dickie, R.A., Chakel, J.

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Spatial chemical analysis of polymer laminates and conducting organic films using SIMS von deVries, J. E., Holubka, J. W., Prater, T. J., Kaberline, S. L., Schuetzle, D., McIntyre, N. S., Chauvin, W.

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