A comparison of cleaning procedures for removing potassium from wafers exposed to KOH von Aslam, M., Artz, B.E., Kaberline, S.L., Prater, T.J.

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Migration of hindered amine light stabilizers in automotive clearcoats von Nichols, M. E., Kaberline, S. L.

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Assessment of photooxidation in multi-layer coating systems by time-of-flight secondary ion mass spectrometry von Gerlock, J.L., Prater, T.J., Kaberline, S.L., deVries, J.E.

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Characterization of interfacial chemistries associated with polymer systems by spatially resolved surface analytical methodologies von deVries, J.E., Haack, L.P., Prater, T.J., Kaberline, S.L., Gerlock, J.L., Holubka, J.W., Dickie, R.A., Chakel, J.

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XPS mapping technique for the identification of adhesion loss mechanisms von Haack, L. P., DeBolt, M. A., Kaberline, S. L., Devries, J. E., Dickie, R. A.

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O sup - time-of-flight secondary ion mass spectrometry technique to map the relative photooxidation resistance of automotive paint systems von Gerlock, J L, Prater, T J, Kaberline, S L, Dupuie, J L, Blais, E J, Rardon, D E

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O exp - time-of-flight secondary ion mass spectrometry technique to map the relative photooxidation resistance of automotive paint systems von Gerlock, J L, Prater, T J, Kaberline, S L, Dupuie, J L, Blais, E J, Rardon, D E

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18O− time-of-flight secondary ion mass spectrometry technique to map the relative photooxidation resistance of automotive paint systems von Gerlock, J.L, Prater, T.J, Kaberline, S.L, Dupuie, J.L, Blais, E.J, Rardon, D.E

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Spatial chemical analysis of polymer laminates and conducting organic films using SIMS von deVries, J. E., Holubka, J. W., Prater, T. J., Kaberline, S. L., Schuetzle, D., McIntyre, N. S., Chauvin, W.

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Spacial chemical analysis of polymer laminates and conducting organic films using SIMS von DEVRIES, J. E, HOLUBKA, J. W, PRATER, T. J, KABERLINE, S. L, SCHUETZLE, D, MCINTYRE, N. S, CHAUVIN, W

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Large-scale mass spectral analysis by simplex pattern recognition von Lam, T. Fai, Wilkins, Charles L, Brunner, Thomas R, Soltzberg, Leonard J, Kaberline, Steven L

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Evaluation and comparison of pattern classifiers for chemical applications von Soltzberg, Leonard J, Wilkins, Charles L, Kaberline, Steven L, Lam, T. Fai, Brunner, Thomas R

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Evaluation of the super-modified simplex for use in chemical pattern recognition von Kaberline, Steven L., Wilkins, Charles L.

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Simplex pattern recognition applied to carbon-13 nuclear magnetic resonance spectrometry von Brunner, Thomas R, Wilkins, Charles L, Lam, T. Fai, Soltzberg, Leonard J, Kaberline, Steven L

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Evaluation and comparison of pattern classifiers for chemical applications: adaptive digital learning networks and linear discriminants von Soltzberg, Leonard J, Wilkins, Charles L, Kaberline, Steven L, Lam, T. Fai, Brunner, T. L

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Composition of Clusters Formed by Plasma Discharge in Simulated Engine Exhaust von Hoard, John, Bretz, Richard L., Kaberline, Steven, Haack, Larry P., Kalashnikov, Eugenii

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