Variability-aware cryogenic models of mosfets: validation and circuit design von Kabao lu, Aykut, ahin-Solmaz, Nergiz, lik, Sad k, Uzun, Yasemin, Yelten, Mustafa Berke

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Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3 von Ilik, Sadik, Kabaoglu, Aykut, Sahin Solmaz, Nergiz, Yelten, Mustafa Berke

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Statistical MOSFET Modeling Methodology for Cryogenic Conditions von Kabaoglu, Aykut, Solmaz, Nergiz Sahin, Ilik, Sadik, Uzun, Yasemin, Yelten, Mustafa Berke

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