Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits von Paul, B.C., Kunhyuk Kang, Kufluoglu, H., Alam, M.A., Roy, K.

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Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis von Kang, K., Kufluoglu, H., Roy, K., Ashraful Alam, M.

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Impact of NBTI on the temporal performance degradation of digital circuits von Paul, B.C., Kunhyuk Kang, Kufluoglu, H., Alam, M.A., Roy, K.

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On-Chip Variability Sensor Using Phase-Locked Loop for Detecting and Correcting Parametric Timing Failures von Kunhyuk Kang, Sang Phill Park, Keejong Kim, Roy, K.

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Variation Estimation and Compensation Technique in Scaled LTPS TFT Circuits for Low-Power Low-Cost Applications von Jing Li, Kunhyuk Kang, Roy, K.

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Temporal Performance Degradation under NBTI: Estimation and Design for Improved Reliability of Nanoscale Circuits von Paul, B.C., Kunhyuk Kang, Kufluoglu, H., Ashraful Alam, M., Roy, K.

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Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input Switching von Seung Hoon Choi, Kunhyuk Kang, Dartu, F., Roy, K.

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Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI von Kang, Kunhyuk, Kufluoglu, Haldun, Alam, Muhammad Ashraful, Roy, Kaushik

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Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ von Kunhyuk Kang, Alam, M.A., Roy, K.

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Device-aware yield-centric Dual-Vt design under parameter variations in nanoscale technologies von AGARWAL, Amit, KUNHYUK KANG, BHUNIA, Swarup, GALLAGHER, James D, ROY, Kaushik

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Reliability Implications of Bias-Temperature Instability in Digital ICs von Park, S.P., Kunhyuk Kang, Roy, K.

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Statistical Timing Analysis using Levelized Covariance Propagation von Kang, Kunhyuk, Paul, Bipul C., Roy, Kaushik

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Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring von Saibal Mukhopadhyay, Kunhyuk Kang, Hamid Mahmoodi, Kaushik Roy

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Device-Aware Yield-Centric Dual- V Design Under Parameter Variations in Nanoscale Technologies von Agarwal, A., Kunhyuk Kang, Bhunia, S., Gallagher, J.D., Roy, K.

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Estimation of NBTI Degradation using IDDQ Measurement von Kunhyuk Kang, Alam, M.A., Roy, K.

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Variation resilient low-power circuit design methodology using on-chip phase locked loop von Kang, Kunhyuk, Kim, Keejong, Roy, Kaushik

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High performance and low power electronics on flexible substrate von Li, Jing, Kang, Kunhyuk, Bansal, Aditya, Roy, Kaushik

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NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? von Kang, Kunhyuk, Gangwal, Saakshi, Park, Sang Phill, Kaushik, Roy

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Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance von Kunhyuk Kang, Park, S.P., Roy, K., Alam, M.A.

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Characterization and estimation of circuit reliability degradation under NBTI using on-line IDDQ measurement von Kang, Kunhyuk, Kim, Keejong, Islam, Ahmad E., Alam, Muhammad A., Roy, Kaushik

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