State Transition of a Defect Causing Random-Telegraph-Noise Fluctuation in Stress-Induced Leakage Current of Thin SiO2 Films in a Metal--Oxide--Silicon Structure von Ishida, Takeshi, Tega, Naoki, Mori, Yuki, Miki, Hiroshi, Mine, Toshiyuki, Kume, Hitoshi, Torii, Kazuyoshi, Yamada, Ren-ichi, Shiraishi, Kenji

Volltext

Impact of threshold voltage fluctuation due to random telegraph noise on scaled-down SRAM von Tega, N., Miki, H., Yamaoka, M., Kume, H., Toshiyuki Mine, Ishida, T., Yuki Mori, Yamada, R., Kazuyoshi Torii

Volltext

DEVELOPMENT OF CRACK INITIATION MONITORING SYSTEM OF LIGHTING PILLARS BY SOUND PROPAGA-TION CHARACTERISTICS von KOBAYASHI, Seiji, AMANO, Naoki, KUME, Hitoshi

Volltext

Mechanism of state transition of a defect causing random-telegraph-noise-induced fluctuation in stress-induced leakage current of SiO 2 films von Ishida, Takeshi, Tega, Naoki, Mori, Yuki, Miki, Hiroshi, Mine, Toshiyuki, Kume, Hitoshi, Torii, Kazuyoshi, Yamada, Ren-ichi, Shiraishi, Kenji

Volltext

Mechanism of state transition of a defect causing random-telegraph-noise-induced fluctuation in stress-induced leakage current of SiO2 films von Ishida, Takeshi, Tega, Naoki, Mori, Yuki, Miki, Hiroshi, Mine, Toshiyuki, Kume, Hitoshi, Torii, Kazuyoshi, Yamada, Ren-ichi, Shiraishi, Kenji

Volltext

Mechanism of state transition of a defect causing random-telegraph-noise-induced fluctuation in stress-induced leakage current of SiO sub(2) films von Ishida, Tega, Naoki, Mori, Yuki, Miki, Hiroshi, Mine, Toshiyuki, Kume, Hitoshi, Torii, Kazuyoshi, Yamada, Ren-ichi, Shiraishi

Volltext

State Transition of a Defect Causing Random-Telegraph-Noise Fluctuation in Stress-Induced Leakage Current of Thin SiO 2 Films in a Metal–Oxide–Silicon Structure von Ishida, Takeshi, Tega, Naoki, Mori, Yuki, Miki, Hiroshi, Mine, Toshiyuki, Kume, Hitoshi, Torii, Kazuyoshi, Yamada, Ren-ichi, Shiraishi, Kenji

Volltext

State Transition of a Defect Causing Random-Telegraph-Noise Fluctuation in Stress-Induced Leakage Current of Thin SiO sub(2) Films in a Metal-Oxide-Silicon Structure von Ishida, Takeshi, Tega, Naoki, Mori, Yuki, Miki, Hiroshi, Mine, Toshiyuki, Kume, Hitoshi, Torii, Kazuyoshi, Yamada, Ren-ichi, Shiraishi, Kenji

Volltext

On the Evaluation of R&D Performance of Engineering Departments von Kume, Hitoshi

Volltext

A Summary of the Activities of the 5th Division in the 19th Term von Kume, Hitoshi

Volltext

Propositions to Science and Technology Policy of Japanese Government von Kume, Hitoshi

Volltext

Management Strategy and Control of Its Risk von Kume, Hitoshi

Volltext

A case history analysis of software error cause-effect relationships von Nakajo, T., Kume, H.

Volltext

New Observation of Hot-Carrier Injection Phenomena von Nakagome, Yoshinobu, Takeda, Eiji, Kume, Hitoshi, Asai, Shojiro

Volltext

On the Science of Design von Kume, Hitoshi

Volltext

What SCJ can do and What SCJ should do von Kume, Hitoshi

Volltext

On the Bird's-eye Research Project von Kume, Hitoshi

Volltext

Semiconductor device von KUME HITOSHI, HANZAWA SATORU

Volltext bestellen

Managerial problems for failure prevention von Kume, Hitoshi

Volltext

On Evaluations von Kume, Hitoshi

Volltext