Electron interferometry at a metal-semiconductor interface von KUBBY, J. A, GREENE, W. J

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Scanning tunneling microscopy of semiconductor surfaces von Kubby, J.A., Boland, J.J.

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Electron interferometry at a heterojunction interface von Kubby, JA, Wang, YR, Greene, WJ

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Imaging misfit dislocations in epitaxial CoSi2/Si(111) layers using quantum size microscopy von KUBBY, J. A, GREENE, W. J

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Tunneling microscopy of Ge(001) von KUBBY, J. A, GRIFFITH, J. E, BECKER, R. S, VICKERS, J. S

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Tunneling images of biatomic steps on Si(001) von Wierenga, P E, Kubby, J A, Griffith, J E

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Particle in a variable-size box : the influence of the tip in thin-film electron interferometry von KUBBY, J. A, GREEN, W. J

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Fabry-Pérot transmission resonances in tunneling microscopy von KUBBY, J. A, WANG, Y. R, GREENE, W. J

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Imaging defect formation of the template growth of NiSi2/Si(111) : an application of quantum size microscopy von KUBBY, J. A, WANG, Y. R, GREENE, W. J

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Tunneling images of biatomic steps on Si(001) von WIERENGA, P. E, KUBBY, J. A, GRIFFITH, J. E

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Adaptive optics for biological imaging using direct wavefront sensing von Kubby, J. A., Azucena, O., Tao, X.

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Atomic structure, adsorbate ordering, and mode of growth of the K/Si(100)2×1 surface von Soukiassian, P., Kubby, J. A., Mangat, P., Hurych, Z., Schirm, K. M.

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Imaging misfit dislocations in epitaxial CoSi sub(2)/Si(111) layers using quantum size microscopy von Kubby, J A, Greene, W J

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Structural properties of alkali metal/Si(100)2 × 1 interfaces investigated by PEXAFS and STM von Soukiassian, P., Kim, S.T., Hurych, Z., Kubby, J.A.

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Atomic structure, adsorbate ordering, and mode of growth of the K/Si(100)2 x 1 surface von Soukiassian, P, Kubby, JA, Mangat, P, Hurych, Z, Schirm, KM

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Electron interferometry at o heterojunction interface von KUBBY, J. A, WANG, Y. R, GREENE, W. J

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Structural properties of alkali meta/Si(100)×1 interfaces investigated by PEXAFS and STM von SOUKAISSIAN, P, KIM, S. T, HURYCH, Z, KUBBY, J. A

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Mass driver two: A status report von Snow, W., Dunbar, R., Kubby, J., O'Neill, G.

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Imaging defect formation in the template growth of NiSi 2 /Si(111): An application of quantum size microscopy von Kubby, J. A., Wang, Y. R., Greene, W. J.

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SEM and TEM observations of first and second order sputter-induced topography von Kubby, Joel A., Siegel, Benjamin M.

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