Principles of substrate crosstalk generation in CMOS circuits von Briaire, J., Krisch, S.

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Precursor ion damage and angular dependence of single event gate rupture in thin oxides von Sexton, F.W., Fleetwood, D.M., Shaneyfelt, M.R., Dodd, P.E., Hash, G.L., Schanwald, L.P., Loemker, R.A., Krisch, K.S., Green, M.L., Weir, B.E., Silverman, P.J.

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Gate capacitance attenuation in MOS devices with thin gate dielectrics von Krisch, K.S., Bude, J.D., Manchanda, L.

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Evidence of annealing effects on a high-density Si/SiO2 interfacial layer von Kosowsky, S. D., Pershan, P. S., Krisch, K. S., Bevk, J., Green, M. L., Brasen, D., Feldman, L. C., Roy, P. K.

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Relapse prevention of bipolar disorders: an explorative cluster analytical approach in a randomized controlled psychotherapy study von Hautzinger, Martin

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Rapid thermal oxidation of silicon in N2O between 800 and 1200 °C: Incorporated nitrogen and interfacial roughness von Green, M. L., Brasen, D., Evans-Lutterodt, K. W., Feldman, L. C., Krisch, K., Lennard, W., Tang, H.-T., Manchanda, L., Tang, M.-T.

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Low-temperature furnace-grown reoxidized nitrided oxide gate dielectrics as a barrier to boron penetration von Fang, H., Krisch, K.S., Gross, B.J., Sodini, C.G., Chung, J., Antoniadis, D.A.

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Suppression of interface-state generation in reoxidized nitrided oxide gate dielectrics von Krisch, K. S., Sodini, C. G.

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Tunneling current noise in thin gate oxides von Alers, G. B., Krisch, K. S., Monroe, D., Weir, B. E., Chang, A. M.

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Positive-charge trapping in nitrided oxide and reoxidized nitrided oxide gate dielectrics von KRISCH, K. S, GROSS, B. J, SODINI, C. G

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Immunological studies on the occurrence and properties of chromogranin A and B and secretogranin II in endocrine tumors von Weiler, R, Fischer-Colbrie, R, Schmid, K W, Feichtinger, H, Bussolati, G, Grimelius, L, Krisch, K, Kerl, H, O'Connor, D, Winkler, H

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Growth temperature dependence of the Si(001)/SiO2 interface width von Tang, Mau-Tsu, Evans-Lutterodt, K. W., Green, M. L., Brasen, D., Krisch, K., Manchanda, L., Higashi, G. S., Boone, T.

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Serum neuron‐specific enolase. A marker for response to therapy in seminoma von Kuzmits, R., Schernthaner, G., Krisch, K.

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Kinetic smoothening: Growth thickness dependence of the interface width of the Si(001)/SiO2 interface von Dawson, J. L., Krisch, K., Evans-Lutterodt, K. W., Tang, Mau-Tsu, Manchanda, L., Green, M. L., Brasen, D., Higashi, G. S., Boone, T.

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Monoclonal antibody HISL-19 as an immunocytochemical probe for neuroendocrine differentiation. Its application in diagnostic pathology von Krisch, K, Buxbaum, P, Horvat, G, Krisch, I, Neuhold, N, Ulrich, W, Srikanta, S

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The value of immunohistochemistry in medullary thyroid carcinoma: a systematic study of 30 cases von KRISCH, K., KRISCH, I., HORVAT, G., NEUHOLD, N., ULRICH, W.

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Lectin histochemistry of kidney tumours and its pathomorphological relevance von ULRICH, W., HORVAT, R., KRISCH, K.

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Effect of electronic corrections on the thickness dependence of thin oxide reliability von Alers, G. B., Oates, A. S., Monroe, D., Krisch, K. S., Weir, B. E.

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Histologic tumor regression grades in squamous cell carcinoma of the head and neck after preoperative radiochemotherapy von Braun, O. M., Neumeister, B., Popp, W., Scherrer, R., Dobrowsky, E., Dobrowsky, W., Rausch, E. M., Strassl, H., Krisch, K., Holzner, J. H.

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Solid and cystic tumour of the pancreas; a hormonal-dependent neoplasm? von Wrba, F, Chott, A, Ludvik, B, Schratter, M, Spona, J, Reiner, A, Schernthaner, G, Krisch, K

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