Short distance uniformity and BlackMURA measurements von Rotscholl, Ingo, Krüger, Udo

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Featured Cover von Rotscholl, Ingo, Krüger, Udo

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53‐4: Distinguished Paper: Short Distance Uniformity and BlackMURA Measurements von Rotscholl, Ingo, Krüger, Udo

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50‐3: Aspects of Image Sticking Evaluations Using Imaging Luminance Measurement Devices von Rotscholl, Ingo, Krüger, Udo

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Uncertainty analysis of spectral flux measurement using Monte Carlo simulation von Yaran, Şenel, Kösemen, Zühal Alpaslan, Akkan, Çağri Kaan, Nişancı, Hilal Fatmagül, Krüger, Udo, Sperling, Armin

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20.2: Invited Paper: Fast and Robust High Precision Luminance Image Stitching in Uniformity and DeMURA measurements von Rotscholl, Ingo, Liu, Bob, Krüger, Udo

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16.3: Towards High Precision One Shot EOL Testing for Acquiring Pixel Level Luminance Data von Rotscholl, Ingo, Liu, Bob, Krüger, Udo

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30‐1: High‐Precision High‐Resolution Measurements within Moire von Rotscholl, Ingo, Krüger, Udo, Schmidt, Franz

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Sparkle measurements for an automotive specification: Evaluation method for flexible setup conditions von Rotscholl, Ingo, Schlipf, Andreas, Rickers, Christoph, Krüger, Udo

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Evaluation of different general V(λ) mismatch indices of photometers for LED-based light sources in general lighting applications von Krüger, Udo, Ferrero, Alejandro, Mantela, Ville, Thorseth, Anders, Trampert, Klaus, Pellegrino, Olivier, Sperling, Armin

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27‐2: Invited Paper: Reproducible Characterization of Microdisplays using Imaging Luminance Measurement Devices (ILMDs) von Rotscholl, Ingo, Kirchhoff, Kilian, Schramm, Stefan, Liu, Bob, Krüger, Udo

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26.3: Advanced Alignment and Metrology Concepts Using Photometric Robotics with Examples for Automotive Displays von Rotscholl, Ingo, Liu, Bob, Krüger, Udo

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71‐4: Imaging Luminance Measuring Devices (ILMDs) ‐ Characterization and Standardization with Respect to Display Measurements von Krüger, Udo, Rotscholl, Ingo, Fong, Alexandre

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29-2: Pixel Crosstalk: A New Metric to Characterize DOI Loss Due to AG Treatments of Display Glasses von Fink, Thomas, Krüger, Udo

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Virtual experiment for near-field goniophotometric measurements von Schmähling, Franko, Wübbeler, Gerd, Lopez, Marco, Gassmann, Frank, Krüger, Udo, Schmidt, Franz, Sperling, Armin, Elster, Clemens

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Uncertainty evaluation and propagation for spectral measurements von Schmähling, Franko, Wübbeler, Gerd, Krüger, Udo, Ruggaber, Benjamin, Schmidt, Franz, Taubert, Richard D., Sperling, Armin, Elster, Clemens

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72‐1: Requests to Lenses in Measuring Units Evaluating Near‐Eye Displays von Schuster, Norbert, Krüger, Udo, Porsch, Tobias

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Hyperspectral LED models for optical simulations von Rotscholl, Ingo, Katona, Markus, Trampert, Klaus, Krüger, Udo, Schmidt, Franz, Neumann, Cornelius

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29-4: Image Blurring Induced by Scattering Anti-Glare Layers von Becker, Michael E., Fink, Thomas, Krüger, Udo

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29-1: Invited Paper: Recent Standardization Efforts and Measurement Procedures of German Automotive OEM and German Flat Panel Forum (DFF) von Blankenbach, Karlheinz, Krüger, Udo, Lauer, Hans-Ulrich, Zobl, Martin

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