HANDHELD FIBRE TEST DEVICE von FAULKNER, Hayden, KOZUB, John Andrew, PULLEN, Benjamin James, SHERRAH, Jamie Roy, STAIKOPOULOS, Vasiliki

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HANDHELD FIBRE TEST DEVICE von FAULKNER, Hayden, KOZUB, John Andrew, PULLEN, Benjamin James, SHERRAH, Jamie Roy, STAIKOPOULOS, Vasiliki

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Enhanced Charge Collection in SiC Power MOSFETs Demonstrated by Pulse-Laser Two-Photon Absorption SEE Experiments von Johnson, Robert A., Witulski, Arthur F., Ball, Dennis R., Galloway, Kenneth F., Sternberg, Andrew L., Zhang, Enxia, Ryder, Landen D., Reed, Robert A., Schrimpf, Ronald D., Kozub, John A., Lauenstein, Jean-Marie, Javanainen, Arto

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Single-Event Transient Response of Vertical and Lateral Waveguide-Integrated Germanium Photodiodes von Ryder, Landen D., Ryder, Kaitlyn L., Sternberg, Andrew L., Kozub, John A., Zhang, En Xia, Linten, Dimitri, Croes, Kristof, Weller, Robert A., Schrimpf, Ronald D., Weiss, Sharon M., Reed, Robert A.

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Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting From Heavy-Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation von Ryder, Kaitlyn L., Ryder, Landen D., Sternberg, Andrew L., Kozub, John A., Zhang, En Xia, LaLumondiere, Stephen D., Monahan, Daniele M., Bonsall, Jeremy P., Khachatrian, Ani, Buchner, Stephen P., McMorrow, Dale, Hales, Joel M., Zhao, Yuanfu, Wang, Liang, Wang, Chuanmin, Weller, Robert A., Schrimpf, Ronald D., Weiss, Sharon M., Reed, Robert A.

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Simulation of Pulsed-Laser-Induced Testing in Microelectronic Devices von Ryder, Landen D., Ryder, Kaitlyn L., Sternberg, Andrew L., Kozub, John A., Khachatrian, Ani, Buchner, Steven P., Mcmorrow, Dale, Hales, Joel M., Zhao, Yuanfu, Wang, Liang, Wang, Chuanmin, Weller, Robert A., Schrimpf, Ronald D., Weiss, Sharon M., Reed, Robert A.

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Polarization Dependence of Pulsed Laser-Induced SEEs in SOI FinFETs von Ryder, Landen D., Ryder, Kaitlyn L., Sternberg, Andrew L., Kozub, John A., Gong, Huiqi, Zhang, En Xia, Linten, Dimitri, Mitard, Jerome, Weller, Robert A., Schrimpf, Ronald D., Weiss, Sharon M., Reed, Robert A.

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Comparison of Sensitive Volumes Associated With Ion- and Laser-Induced Charge Collection in an Epitaxial Silicon Diode von Ryder, Kaitlyn L., Zhao, Yuanfu, Wang, Liang, Wang, Chuanmin, Weller, Robert A., Schrimpf, Ronald D., Weiss, Sharon M., Reed, Robert A., Ryder, Landen D., Sternberg, Andrew L., Kozub, John A., Zhang, En Xia, Khachatrian, Ani, Buchner, Steven P., Mcmorrow, Dale P., Hales, Joel M.

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Pulsed-Laser Induced Single-Event Transients in InGaAs FinFETs on Bulk Silicon Substrates von Huiqi Gong, Kai Ni, En Xia Zhang, Sternberg, Andrew L., Kozub, John A., Alles, Michael L., Reed, Robert A., Fleetwood, Daniel M., Schrimpf, Ronald D., Waldron, Niamh, Kunert, Bernardette, Linten, Dimitri

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Understanding Charge Collection Mechanisms in InGaAs FinFETs Using High-Speed Pulsed-Laser Transient Testing With Tunable Wavelength von Kai Ni, Sternberg, Andrew L., En Xia Zhang, Kozub, John A., Rong Jiang, Schrimpf, Ronald D., Reed, Robert A., Fleetwood, Daniel M., Alles, Michael L., McMorrow, Dale, Jianqiang Lin, Vardi, Alon, del Alamo, Jesus

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Scaling Effects on Single-Event Transients in InGaAs FinFETs von Gong, Huiqi, Ni, Kai, Zhang, En Xia, Sternberg, Andrew L., Kozub, John A., Ryder, Kaitlyn L., Keller, Ryan F., Ryder, Landen D., Weiss, Sharon M., Weller, Robert A., Alles, Michael L., Reed, Robert A., Fleetwood, Daniel M., Schrimpf, Ronald D., Vardi, Alon, del Alamo, Jesus A.

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Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area von Wang, Peng, Sternberg, Andrew L., Kozub, John A., Zhang, En Xia, Dodds, Nathaniel A., Jordan, Scott L., Fleetwood, Daniel M., Reed, Robert A., Schrimpf, Ronald D.

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Comparison of Sensitive Volumes Associated with Ion-and Laser-Induced Charge Collection in an Epitaxial Silicon Diode von Ryder, Kaitlyn L., Ryder, Landen D., Sternberg, Andrew L., Kozub, John A., Zhang, En Xia, Khachatrian, Ani, Buchner, Steven P., McMorrow, Dale P., Hales, Joel M., Zhao, Yuanfu, Wang, Liang, Wang, Chuanmin, Weller, Robert A., Schrimpf, Ronald D., Weiss, Sharon M., Reed, Robert A.

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Experiments with liquid metal walls: Status of the lithium tokamak experiment von Kaita, Robert, Berzak, Laura, Boyle, Dennis, Gray, Timothy, Granstedt, Erik, Hammett, Gregory, Jacobson, Craig M., Jones, Andrew, Kozub, Thomas, Kugel, Henry, Leblanc, Benoit, Logan, Nicholas, Lucia, Matthew, Lundberg, Daniel, Majeski, Richard, Mansfield, Dennis, Menard, Jonathan, Spaleta, Jeffrey, Strickler, Trevor, Timberlake, John, Yoo, Jongsoo, Zakharov, L., Maingi, Rajesh, Soukhanovskii, Vlad, Tritz, Kevin, Gershman, Sophia

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Angle Dependence of Focused X-Ray-Induced Single Event Transients von Ryder, Kaitlyn L, Ryder, Landen D, Sternberg, Andrew L., Kozub, John A., Zhang, En Xia, LaLumondiere, Stephen D., Monahan, Daniele M., Bonsall, Jeremy P., Weller, Robert A, Schrimpf, Ronald D., Reed, Robert A.

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Mechanisms of Heavy Ion-, Focused X-Ray-, and Pulsed Laser-Induced Single Event Transients in an Epitaxial Silicon Diode von Ryder, Kaitlyn L., Ryder, Landen D., Sternberg, Andrew L., Kozub, John A., Zhang, EnXia, LaLumondiere, Stephen D., Monahan, Daniele M., Bonsall, Jeremy P., Khachatrian, Ani, Buchner, Steven P., McMorrow, Dale, Hales, Joel M., Zhao, Yuanfu, Wang, Liang, Wang, Chuanmin, Weller, Robert A., Schrimpf, Ronald D., Weissb, Sharon M., Reed, Robert A.

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Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting from Heavy Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation von Ryder, Kaitlyn L, Ryder, Landen D, Sternberg, Andrew L, Kozub, John A., Zhang, En Xia, LaLumondiere, Stephen D., Monahan, Daniele M., Bonsall, Jeremey P., Khachatrian, Ani, Buchner, Stephen P., McMorrow, Dale, Hales, Joel M., Zhao, Yuanfu, Wang, Liang, Wang, Chuanmin, Weller, Robert A., Schrimpf, Ronald D., Weiss, Sharon M., Reed, Robert A.

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