Charging effects in silicon nanocrystals within SiO2 layers, fabricated by chemical vapor deposition, oxidation, and annealing von Kouvatsos, D. N., Ioannou-Sougleridis, V., Nassiopoulou, A. G.

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Hydrogen passivation on Sequential Lateral Solidified poly-Si TFTs von Michalas, L., Koutsoureli, M., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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On the study of p-channel thin-film transistors fabricated by SLS ELA crystallization techniques von Exarchos, M.A., Moschou, D.C., Papaioannou, G.J., Kouvatsos, D.N., Arapoyanni, A., Voutsas, A.T.

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On the analytic assessment of the impact of traffic correlation on queues in continuous time domain von Li, Wei, Kouvatsos, Demetres D., Fretwell, Rod J.

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Back gate influence on front channel operation of p-channel double gate polysilicon TFTs von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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Nickel nanoparticle deposition at room temperature for memory applications von Verrelli, E., Tsoukalas, D., Giannakopoulos, K., Kouvatsos, D., Normand, P., Ioannou, D.E.

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Photoluminescence from nanocrystalline silicon in Si/SiO2 superlattices von Photopoulos, P., Nassiopoulou, A. G., Kouvatsos, D. N., Travlos, A.

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Effect of silicon thickness on the degradation mechanisms of sequential laterally solidified polycrystalline silicon TFTs during hot-carrier stress von Voutsas, A.T., Kouvatsos, D.N., Michalas, L., Papaioannou, G.J.

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Gate/drain bias-induced degradation effects in TFTs fabricated in unhydrogenated SPC polycrystalline silicon films von Kouvatsos, D.N., Davazoglou, D.

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Network Performance Engineering: A Handbook on Convergent Multi-Service Networks and Next Generation Internet von Kouvatsos, Demetres D

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Deposition and electrical characterization of hafnium oxide films on silicon von Verrelli, E., Tsoukalas, D., Kouvatsos, D.

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Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors von Davidović, V., Kouvatsos, D.N., Stojadinović, N., Voutsas, A.T.

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A novel SLS ELA crystallization process and its effects on polysilicon film defectivity and TFT performance von Moschou, Despina C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.

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Investigation of the undershoot effect in polycrystalline silicon thin film transistors von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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Characterization of thin film transistors fabricated on different sequential lateral solidified poly-silicon substrates von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Farmakis, F.V., Voutsas, A.T.

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Device degradation behavior and polysilicon film morphology of thin film transistors fabricated using advanced excimer laser lateral solidification techniques von Kouvatsos, D.N., Voutsas, A.T., Michalas, L., Farmakis, F.V., Papaioannou, G.J.

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Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques von Moschou, D.C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.

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Influence of a high electric field on the photoluminescence from silicon nanocrystals in SiO2 von Ioannou-Sougleridis, V., Kamenev, B., Kouvatsos, D.N., Nassiopoulou, A.G.

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Charging effects in silicon nanocrystals embedded in SiO2 films von Kouvatsos, D.N., Ioannou-Sougleridis, V., Nassiopoulou, A.G.

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An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors von Michalas, L., Exarchos, M., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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