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  1. 1
    OPTIC MEASURING SYSTEM, AND MEASURING METHOD OF CRITICAL SIZE OF NANOSTRUCTURES ON FLAT SURFACE

    OPTIC MEASURING SYSTEM, AND MEASURING METHOD OF CRITICAL SIZE OF NANOSTRUCTURES ON FLAT SURFACE von RJABKO MAKSIM VLADIMIROVICH, KOPTJAEV SERGEJ NIKOLAEVICH, RYCHAGOV MIKHAIL NIKOLAEVICH

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  2. 2
    SYSTEM AND METHOD OF PRINTING INTEGRAL PHOTOGRAPHS PROVIDING FULL PARALLAX AND HIGH RESOLUTION OF THREE-DIMENSIONAL IMAGE (VERSIONS)

    SYSTEM AND METHOD OF PRINTING INTEGRAL PHOTOGRAPHS PROVIDING FULL PARALLAX AND HIGH RESOLUTION OF THREE-DIMENSIONAL IMAGE (VERSIONS) von ANIKANOV ALEKSEJ GRIGOR'EVICH, P'JUN K'JUNGSUK, KOPTJAEV SERGEJ NIKOLAEVICH, BUCHA VIKTOR VALENTINOVICH, RYCHAGOV MIKHAIL NIKOLAEVICH

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  3. 3
    OPTICAL MEASUREMENT SYSTEM AND METHOD TO MEASURE CRITICAL SIZE

    OPTICAL MEASUREMENT SYSTEM AND METHOD TO MEASURE CRITICAL SIZE von LANTSOV ALEKSEJ DMITRIEVICH, RJABKO MAKSIM VLADIMIROVICH, KOPTJAEV SERGEJ NIKOLAEVICH, SHCHERBAKOV ALEKSANDR VJACHESLAVOVICH

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