Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy von Ishikawa, Ryo, Okunishi, Eiji, Sawada, Hidetaka, Kondo, Yukihito, Hosokawa, Fumio, Abe, Eiji

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Differential phase-contrast microscopy at atomic resolution von Shibata, Naoya, Findlay, Scott D., Kohno, Yuji, Sawada, Hidetaka, Kondo, Yukihito, Ikuhara, Yuichi

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2.5-dimensional covalent organic frameworks von Kitano, Tomoki, Goto, Syunto, Wang, Xiaohan, Kamihara, Takayuki, Sei, Yoshihisa, Kondo, Yukihito, Sannomiya, Takumi, Uekusa, Hidehiro, Murakami, Yoichi

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Synthesis and Characterization of Helical Multi-Shell Gold Nanowires von Kondo, Yukihito, Takayanagi, Kunio

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Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution von Yang, Hao, MacLaren, Ian, Jones, Lewys, Martinez, Gerardo T., Simson, Martin, Huth, Martin, Ryll, Henning, Soltau, Heike, Sagawa, Ryusuke, Kondo, Yukihito, Ophus, Colin, Ercius, Peter, Jin, Lei, Kovács, András, Nellist, Peter D.

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Experimental study of annular bright field (ABF) imaging using aberration-corrected scanning transmission electron microscopy (STEM) von Okunishi, Eiji, Sawada, Hidetaka, Kondo, Yukihito

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Scanning moiré fringe imaging for quantitative strain mapping in semiconductor devices von Kim, Suhyun, Lee, Sungho, Oshima, Yoshifumi, Kondo, Yukihito, Okunishi, Eiji, Endo, Noriaki, Jung, Jaeryong, Byun, Gwangsun, Lee, Sunyoung, Lee, Kyupil

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Magnified pseudo-elemental map of atomic column obtained by Moiré method in scanning transmission electron microscopy von Kondo, Yukihito, Okunishi, Eiji

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Quantized conductance through individual rows of suspended gold atoms von Ohnishi, Hideaki, Kondo, Yukihito, Takayanagi, Kunio

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Development of Cs and Cc correctors for transmission electron microscopy von Hosokawa, Fumio, Sawada, Hidetaka, Kondo, Yukihito, Takayanagi, Kunio, Suenaga, Kazutomo

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Strained hetero interfaces in Si/SiGe/SiGe/SiGe multi-layers studied by scanning moiré fringe imaging von Kim, Suhyun, Lee, Sungho, Kondo, Yukihito, Lee, Kyungwoo, Byun, Gwangsun, Lee, Sunyoung, Lee, Kyupil

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Gold Nanobridge Stabilized by Surface Structure von Kondo, Yukihito, Takayanagi, Kunio

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Accuracy of Strain in Strain Maps Improved by Averaging Multiple Maps von Endo, Noriaki, Kondo, Yukihito

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Quantitative measurement of strain field in strained-channel-transistor arrays by scanning moiré fringe imaging von Kim, Suhyun, Kondo, Yukihito, Lee, Kyungwoo, Byun, Gwangsun, Jung Kim, Joong, Lee, Sunyoung, Lee, Kyupil

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Morphology of phase-separated VO2 films deposited on TiO2-(001) substrate von Cho, Youngji, Aritomi, Shodai, Kanki, Teruo, Kinoshita, Koichi, Endo, Noriaki, Kondo, Yukihito, Shindo, Daisuke, Tanaka, Hidekazu, Murakami, Yasukazu

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Phase-contrast scanning transmission electron microscopy von Minoda, Hiroki, Tamai, Takayuki, Iijima, Hirofumi, Hosokawa, Fumio, Kondo, Yukihito

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Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy von Oshima, Yoshifumi, Sawada, Hidetaka, Hosokawa, Fumio, Okunishi, Eiji, Kaneyama, Toshikatsu, Kondo, Yukihito, Niitaka, Seiji, Takagi, Hidenori, Tanishiro, Yasumasa, Takayanagi, Kunio

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Reproducible strain measurement in electronic devices by applying integer multiple to scanning grating in scanning moiré fringe imaging von Kim, Suhyun, Jung, Younheum, Kim, Joong Jung, Lee, Sunyoung, Lee, Haebum, Kondo, Yukihito

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Counting lithium ions in the diffusion channel of an LiV2O4 crystal von Lee, Soyeon, Oshima, Yoshifumi, Sawada, Hidetaka, Hosokawa, Fumio, Okunishi, Eiji, Kaneyama, Toshikatsu, Kondo, Yukihito, Niitaka, Seiji, Takagi, Hidenori, Tanishiro, Yasumasa, Takayanagi, Kunio

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Accelerating Voltage and Probe Current Dependence of Electron Beam Drilling Rates for Silicon Crystal von Endo, Noriaki, Kondo, Yukihito

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