Treffer 1 - 5 von 5 für Suche 'KOENEMANN BERND K. F', Suchdauer: 0,42s Treffer weiter einschränken
  1. 1
    Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer

    Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer von WHEATER DONALD L, LACKEY DAVID E, KELLER BRION L, KOENEMANN BERND K. F

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  2. 2
    Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer

    Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer von Keller, Brion L, Koenemann, Bernd K. F, Lackey, David E, Wheater, Donald L

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  3. 3
    Clocking mechanism for delay, short path and stuck-at testing

    Clocking mechanism for delay, short path and stuck-at testing von MCANNEY, WILLIAM H, SHULMAN, MARK L, KOENEMANN, BERND K. F

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  4. 4
    Hybrid pattern self-testing of integrated circuits

    Hybrid pattern self-testing of integrated circuits von WAGNER, KENNETH D, WAICUKAUSKI, JOHN A, KOENEMANN, BERND K. F

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  5. 5
    Method and apparatus for memory dynamic burn-in and test

    Method and apparatus for memory dynamic burn-in and test von BERRY, JR., ROBERT W, WAGNER, KENNETH D, YASAR, GULSUN, SHEPHARD, III, PHILIP G, SCARPERO, JR., WILLIAM J, KOENEMANN, BERND K. F

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