Control of Three-Phase Inverter for AC Motor Drive With Small DC-Link Capacitor Fed by Single-Phase AC Source von Jung, Hyun-Sam, Chee, Seung-Jun, Sul, Seung-Ki, Park, Young-Jae, Park, Hyun-Soo, Kim, Woo-Kyu

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Increased intestinal macromolecular permeability and urine nitrite excretion associated with liver cirrhosis with ascites von Lee, Soong, Son, Seung-Cheol, Han, Moon-Jong, Kim, Woo-Jin, Kim, Soo-Hyun, Kim, Hye-Ran, Jeon, Woo-Kyu, Park, Ki-Hong, Shin, Myung-Geun

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The (Ph)2nacnac Ligand in Organochromium Chemistry von MacAdams, Leonard A, Kim, Woo-Kyu, Liable-Sands, Louise M, Guzei, Ilia A, Rheingold, Arnold L, Theopold, Klaus H

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[(Ph)2nacnac]MCl2(THF)2 (M = Ti, V, Cr):  A New Class of Homogeneous Olefin Polymerization Catalysts Featuring β-Diiminate Ligands von Kim, Woo-Kyu, Fevola, Michael J, Liable-Sands, Louise M, Rheingold, Arnold L, Theopold, Klaus H

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Different risk factors for advanced colorectal neoplasm in young adults von Kim, Ji Yeon, Jung, Yoon Suk, Park, Jung Ho, Kim, Hong Joo, Cho, Yong Kyun, Sohn, Chong Il, Jeon, Woo Kyu, Kim, Byung Ik, Choi, Kyu Yong, Park, Dong Il

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193 nm Resist Line Collapse Study by Modifying the Resist Polymer and Process Conditions with Utilizing FIRM Process von Tanaka, Keiichi, Yamada, Yoshiaki, Masuda, Seiya, Kobayashi, Masakazu, Kim, Woo-Kyu, Anyadiegwu, Clement, Padamanaban, Murirathna, Dammel, Ralph R.

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Influence of ArF Resist Components and Process Conditions on the PEB Sensitivity von Padmanaban, Munirathna, Anyadiegwu, Clement, Kanda, Takashi, Kim, Woo-Kyu, Kudo, Takanori, McKenzie, Douglas, Rahman, Dalil, Dammel, Ralph, Lee, SangHo

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Control of three phase inverter for AC motor drive with small DC-link capacitor fed by single phase AC source von Hyun-Sam Jung, Seung-Jun Chee, Seung-Ki Sul, Young-Jae Park, Hyun-Soo Park, Woo-Kyu Kim

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Layer-Specific Resists for 193nm Lithography von Padmanaban, Munirathna, Bae, Jun-Bom, Kim, Woo-Kyu, Kudo, Takanori, Rahman, M. Dalil, Dammel, Ralph R.

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Recovery of cerium from glass polishing slurry von Kim, Jong-Young, Kim, Ung-Soo, Byeon, Myeong-Seop, Kang, Woo-Kyu, Hwang, Kwang-Teak, Cho, Woo-Seok

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Materials and Resists for 193 and 157nm Applications von Padmanaban, Munirathna, Alemy, Eric, Bae, Jun-Bom, Kim, Woo-Kyu, Kudo, Takanori, Masuda, Seiya, Rahman, Dalil, Sakamuri, Raj, Dammel, Ralph, Jung, Jae-Chang, Lee, Sung-Koo, Shin, Ki-Soo

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Etch Properties of 193nm Resists: Issues and Approaches von Padmanaban, Munirathna, Alemy, Eric, Dammel, Ralph, Kim, Woo-Kyu, Kudo, Takanori, Lee, SangHo, Rahman, Dalil, Chen, Wan-Lin, Sadjadi, Reza M., Livesay, William, Ross, Matthew

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Optimization of 193 nm Contact Hole Resists for 100 nm Node von Kudo, Takanori, Alemy, Eric L., Dammel, Ralph R., Kim, Woo-Kyu, Lee, Sang-Ho, Masuda, Seiya, McKenzie, Douglas, Rahman, M. Dalil, Romano, Andrew, Padmanaban, Munirathna, Chun, Jun-Sung, Jung, Jae-Chang, Lee, Sung-Koo, Shin, Ki-Soo, Kim, Hyeong-Soo

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Leaching Phenomena and their Suppresion in 193 nm Immersion Lithography von Dammel, Ralph R., Pawlowski, Georg, Romano, Andrew, Hoolihan, Frank M., Kim, Woo-Kyu, Sakmuri, Raj, Abdallah, David, Padmanaban, Murirathna, Rahman, M. Dalil, McKenzie, Douglas

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Sensitized Transparent Photobase Additive For 193 nm Lithography von Padmanaban, Munirathna, Bae, Jun-Born, Cook, Michelle, Kim, Woo-Kyu, Klauck-Jacobs, Axel, Kudo, Takanori, Rahman, M. Dalil, Dammel, Ralph R, Byers, Jeffrey D.

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Epidermal growth factor upregulates Skp2/Cks1 and p27kip1 in human extrahepatic cholangiocarcinoma cells von Kim, Ja-yeon, Kim, Hong Joo, Park, Jung Ho, Park, Dong Il, Cho, Yong Kyun, Sohn, Chong Il, Jeon, Woo Kyu, Kim, Byung Ik, Kim, Dong Hoon, Chae, Seoung Wan, Sohn, Jin Hee

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Metabolic syndrome is associated with erosive esophagitis von Park, Jung-Ho, Park, Dong-Il, Kim, Hong-Joo, Cho, Yong-Kyun, Sohn, Chong-Il, Jeon, Woo-Kyu, Kim, Byung-Ik

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Comparison of brush and basket cytology in differential diagnosis of bile duct stricture at endoscopic retrograde cholangiopancreatography von Bang, Ki Bae, Kim, Hong Joo, Park, Jung Ho, Park, Dong Il, Cho, Yong Kyun, Sohn, Chong Il, Jeon, Woo Kyu, Kim, Byung Ik

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Mechanistic Studies on the CD Degradation of 193nm Resists during SEM Inspection von Kudo, Takanori, Dammel, Ralph R., Bae, Jun-Born, Rahman, M. Dalil, Kim, Woo-Kyu, McKenzie, Douglas, Alemy, Eric L., Ng, Waiman, Padmanaban, Munirathna

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INTEGRATED CIRCUIT INCLUDING BACKSIDE WIRING AND METHOD OF DESIGNING THE SAME von KIM WOO KYU, LEE SEUNG MIN, KIM CHANG BEOM, DO JUNG HO

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