Advanced spectroscopic methods for probing in-gap defect states in amorphous SiNx for charge trap memory applications von Kim, Hyun Don, Gu, Minseon, Lee, Kyu-Myung, Ahn, Hanyeol, Byun, Jinwoo, Yon, Gukhyon, Beak, Junghyun, Lim, Hyeongjoon, Jung, Jaemo, Park, Jaehyeon, Kim, Jwa Soon, Hahm, HaeJoon, Kim, Soobang, Min, Won Ja, Hyun, Moon Seop, Chang Park, Yun, Kim, Gyungtae, Park, Yongsup, Han, Moonsup, Choi, Eunjip, Chang, Young Jun

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Quantitative hydrogen analysis through time of flight-elastic recoil detection analysis using medium energy ions von Park, Kyungsu, Kim, Jwa Soon, An, Sung Yup, Jung, Kwang Hwan, Kim, Soobang, Yu, Kyu-Sang, Min, Won Ja

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ANALYSIS SYSTEM WITH TOF-MEIS von KIM WAN SUP, YU KYU SANG, KIM SOOBANG, PARK KYUNGSU, MIN WON JA, HWANG YOUNG BOK, KIM HYO DONG, HWANG JI MIN

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TOF-MEIS SIGNAL IMPROVEMENT SYSTEM OF TOF-MEIS von YU KYU SANG, KIM WAN SUP, KIM SOOBANG, MIN WON JA, PARK KYUNG SU, HWANG YOUNG BOK, KIM HYO DONG, SIM CHANG SIK

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Semiconductor device von KIM SOOBANG, KIM YONGDON, JANG DONG-EUN, LEE EUNGKYU, BAE SUNGRYOUL

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