Direct observation of nanometer-scale strain field around CoSi2/Si interface using scanning moiré fringe imaging von Kim, Suhyun, Jung, Younheum, Jung Kim, Joong, Byun, Gwangseon, Lee, Sunyoung, Lee, Haebum

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Quantitative measurement of strain field in strained-channel-transistor arrays by scanning moiré fringe imaging von Kim, Suhyun, Kondo, Yukihito, Lee, Kyungwoo, Byun, Gwangsun, Jung Kim, Joong, Lee, Sunyoung, Lee, Kyupil

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Largely defocused probe scanning transmission electron microscopy for imaging local modulation of strain field in a hetero interface von Kim, Suhyun, Oshima, Yoshifumi, Jung, Younheum, Kim, Joong Jung, Lee, Sunyoung, Lee, Haebum

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Flexible MoS2 Anchored on Ge-Containing Carbon Nanofibers von Yanilmaz, Meltem, Kim, Jung Joong

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Out-of-Focus STEM Method for Imaging Misfit Dislocations in a Hetero Interface von Kim, Suhyun, Kim, Joong Jung

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Reproducible strain measurement in electronic devices by applying integer multiple to scanning grating in scanning moiré fringe imaging von Kim, Suhyun, Jung, Younheum, Kim, Joong Jung, Lee, Sunyoung, Lee, Haebum, Kondo, Yukihito

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Quantification of ballasted track-bridge interaction behavior due to the temperature variation through field measurements von Yun, Kyung-Min, Bae, Hyun-Ung, Moon, Jiho, Kim, Jung-Joong, Park, Jong-Chan, Lim, Nam-Hyoung

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3D strain measurement in electronic devices using through-focal annular dark-field imaging von Kim, Suhyun, Jung, Younheum, Lee, Sungho, Jung Kim, Joong, Byun, Gwangseon, Lee, Sunyoung, Lee, Haebum

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Cumulative Damage Evaluation of RC Bridge Piers subjected to Multiple Earthquakes von Kim, WooSeok, Kim, Jung Joong, Kim, Byeong Hwa, Lee, Do Hyung

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Publisher's Note: “Direct observation of nanometer-scale strain field around CoSi2/Si interface using scanning moiré fringe imaging” [Appl. Phys. Lett. 104 , 161610 (2014)] von Kim, Suhyun, Jung, Younheum, Kim, Joong Jung, Byun, Gwangseon, Lee, Sunyoung, Lee, Haebum

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Realizing the Creep and Damage Effect on Masonry Panel Design Based on Reliability Analysis von Kim, Jung Joong

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Stress Analysis in a Si1-xGex-Channel-Transistor by Scanning Moiré Fringe Imaging von Suhyun Kim, Younheum Jung, Joong Jung Kim, Sunyoung Lee, Haebum Lee

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Electrical characteristics and thermal stability of n+ polycrystalline- Si/ZrO2/SiO2/Si metal–oxide–semiconductor capacitors von Lim, Kwan-Yong, Park, Dae-Gyu, Cho, Heung-Jae, Kim, Joong-Jung, Yang, Jun-Mo, Choi, II-Sang, Yeo, In-Seok, Park, Jin Won

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Numerical Study on the Improvement of Resistance Performance for Fast-ferry with Transom Appendage von HONG, Chun-Beom, KIM, Jung-Joong

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Analysis of prognostic factors and outcomes of gastric cancer in younger patients:A case control study using propensity score methods von Kim, Ki-Han, Kim, Yoo-Min, Kim, Min-Chan, Jung, Ghap-Joong

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Direct Observation of Field Emission in a Single TaSi2 Nanowire von Kim, Joong Jung, Shindo, Daisuke, Murakami, Yasukazu, Xia, Weixing, Chou, Li-Jen, Chueh, Yu-Lun

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Reliable strain measurement in transistor arrays by robust scanning transmission electron microscopy von Kim, Suhyun, Kim, Joong Jung, Jung, Younheum, Lee, Kyungwoo, Byun, Gwangsun, Hwang, KyoungHwan, Lee, Sunyoung, Lee, Kyupil

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Flexible MoS 2 Anchored on Ge-Containing Carbon Nanofibers von Yanilmaz, Meltem, Kim, Jung Joong

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Flexible MoS[sub.2] Anchored on Ge-Containing Carbon Nanofibers von Yanilmaz, Meltem, Kim, Jung Joong

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Observing the Magnetization Distribution in the Pseudo Soft Underlayer of Perpendicular Magnetic Recording Media by Electron Holography von Hirata, Kei, Ishida, Yoichi, Kasai, Hiroto, Akashi, Tetsuya, Kim, Joong Jung, Yanagisawa, Keiichi, Shindo, Daisuke, Tonomura, Akira

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