Recurrent feature-incorporated convolutional neural network for virtual metrology of the chemical mechanical planarization process von Lee, Ki Bum, Kim, Chang Ouk

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Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels von Park, Seyoung, Jang, Jaeyeon, Kim, Chang Ouk

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Semisupervised sentiment analysis method for online text reviews von Lee, Gyeong Taek, Kim, Chang Ouk, Song, Min

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A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes von Lee, Ki Bum, Cheon, Sejune, Kim, Chang Ouk

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Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class von Cheon, Sejune, Lee, Hankang, Kim, Chang Ouk, Lee, Seok Hyung

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A Deep Learning Model for Robust Wafer Fault Monitoring With Sensor Measurement Noise von Lee, Hoyeop, Kim, Youngju, Kim, Chang Ouk

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A run-to-run controller for a chemical mechanical planarization process using least squares generative adversarial networks von Kim, Sinyoung, Jang, Jaeyeon, Kim, Chang Ouk

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State-Dependent Parameter Tuning of the Apparent Tardiness Cost Dispatching Rule Using Deep Reinforcement Learning von Min, Byungwook, Kim, Chang Ouk

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Performance of Machine Learning Algorithms for Class-Imbalanced Process Fault Detection Problems von Lee, Taehyung, Lee, Ki Bum, Kim, Chang Ouk

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Autonomous Control of Combat Unmanned Aerial Vehicles to Evade Surface-to-Air Missiles Using Deep Reinforcement Learning von Lee, Gyeong Taek, Kim, Chang Ouk

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An Incremental Clustering-Based Fault Detection Algorithm for Class-Imbalanced Process Data von Jueun Kwak, Taehyung Lee, Chang Ouk Kim

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Statistical Comparison of Fault Detection Models for Semiconductor Manufacturing Processes von Taehyung Lee, Chang Ouk Kim

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Automatic inspection of salt-and-pepper defects in OLED panels using image processing and control chart techniques von Kwak, Jueun, Lee, Ki Bum, Jang, Jaeyeon, Chang, Kyong Soo, Kim, Chang Ouk

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Collective Decision of One-vs-Rest Networks for Open-Set Recognition von Jang, Jaeyeon, Kim, Chang Ouk

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Modular Reinforcement Learning for Autonomous UAV Flight Control von Choi, Jongkwan, Kim, Hyeon Min, Hwang, Ha Jun, Kim, Yong-Duk, Kim, Chang Ouk

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Adaptive Weapon-to-Target Assignment Model Based on the Real-Time Prediction of Hit Probability von Jang, Jaeyeon, Yoon, Hyui Geon, Kim, Jeong Cheol, Kim, Chang Ouk

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Stepwise Soft Actor–Critic for UAV Autonomous Flight Control von Hwang, Ha Jun, Jang, Jaeyeon, Choi, Jongkwan, Bae, Jung Ho, Kim, Sung Ho, Kim, Chang Ouk

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Siamese Network-Based Health Representation Learning and Robust Reference-Based Remaining Useful Life Prediction von Jang, Jaeyeon, Kim, Chang Ouk

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Yield Prediction Through the Event Sequence Analysis of the Die Attach Process von Lee, Hoyeop, Kim, Chang Ouk, Ko, Hyo Heon, Kim, Min-Kyoon

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Teacher-Explorer-Student Learning: A Novel Learning Method for Open Set Recognition von Jang, Jaeyeon, Kim, Chang Ouk

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