Image sensor chip von Jang, Minho, Byun, Kyungrae, Kwon, Doowon, Yeo, Hyunyoung, Kim, Dongchan, Kim, Bokwon, Ahn, Jungchak

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IMAGE SENSOR von KIM, Jonguk, LEE, Kwangmin, Lee, Changkyu, KIM, Bokwon, HEO, Minsung, JEON, Minhwan

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IMAGE SENSOR CHIP von Jang, Minho, Byun, Kyungrae, Kwon, Doowon, Yeo, Hyunyoung, Kim, Dongchan, Kim, Bokwon, Ahn, Jungchak

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IMAGE SENSOR von JEON MINHWAN, HEO MINSUNG, KIM BOKWON, KIN SHOKYOKU, LEE CHANG KYU, LEE KWANGMIN

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Slow crack growth in a cordierite-based glass–ceramic missile radome due to stress corrosion von Lee, Changmin, Kim, Ik-Sik, Lee, Bokwon

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M4Ag44(p-MBA)30 Molecular Nanoparticles von Conn, Brian E, Desireddy, Anil, Atnagulov, Aydar, Wickramasinghe, Sameera, Bhattarai, Badri, Yoon, Bokwon, Barnett, Robert N, Abdollahian, Yashar, Kim, Yong Wah, Griffith, Wendell P, Oliver, Scott R. J, Landman, Uzi, Bigioni, Terry P

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Investigation of In-Flight Shutdown of Turboprop Engine Due to Electrical Discharge Damage von Lee, Bokwon, Kim, Gyu-Ho, Karkkainen, Ryan L., Hwang, Young-Ha

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M 4 Ag 44 (p-MBA) 30 Molecular Nanoparticles von Conn, Brian E., Desireddy, Anil, Atnagulov, Aydar, Wickramasinghe, Sameera, Bhattarai, Badri, Yoon, Bokwon, Barnett, Robert N., Abdollahian, Yashar, Kim, Yong Wah, Griffith, Wendell P., Oliver, Scott R. J., Landman, Uzi, Bigioni, Terry P.

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The role and relationship of the serum D-dimer level and autologous serum skin test response in chronic spontaneous urticaria von Park, Bok, Jang, Ye, Cho, Eun, Park, Eun, Kim, Kwang

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Failure analysis of stress corrosion cracking in aircraft bolts von Lee, Hong-Chul, Choi, Jae-man, Lee, Bokwon, Kim, Tae-Gu

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